German Kremer

TL;DR: In this article, the authors measured the resistivity of a gold film 70 nm thick on mica preheated to 300 \ifmmode^\circ\else\textdegree\fi{}C in UHV, performed between 4 and 300 K, and measured the surface topography of the same film performed with a scanning tunneling microscope.

TL;DR: In this paper, the electron scattering at surfaces and grain boundaries is investigated using polycrystalline Au films deposited onto mica substrates, and the authors varied independently the film thickness from approximately 50nm to about 100nm.

TL;DR: In this article, the grain size was adjusted to separate the contribution to the resistivity originating in electron-grain boundary scattering, from that arising in electron surface scattering, on gold films approximately 54 nm thick.

TL;DR: In this article, the authors extended the modified formalism of Sheng, Xing, and Wang to allow the calculation of the conductivity of a thin metallic film bounded by a rough fractal surface.

TL;DR: In this paper, an extension of the theory of Sheng, Xing and Wang (SXW) is presented, which permits the calculation of size effects from statistical properties that characterize the surface on a microscopic scale, for samples in which the average height-height autocorrelation function (ACF) is described either by a Gaussian or by an exponential.