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Giovanni Vinci

Researcher at STMicroelectronics

Publications -  8
Citations -  89

Giovanni Vinci is an academic researcher from STMicroelectronics. The author has contributed to research in topics: Power electronics & Power module. The author has an hindex of 5, co-authored 6 publications receiving 72 citations.

Papers
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Journal ArticleDOI

Electrothermal PSpice Modeling and Simulation of Power Modules

TL;DR: The implementation of a devised flow to generate the layer-based electrothermal PSpice model of an IPEM and the simulation flow of the model are described and the results are compared with a commercial finite-element-based package used as a benchmark.
Proceedings ArticleDOI

Generation of electro-thermal models of integrated power electronics modules using a novel synthesis technique

TL;DR: In this article, a new methodology aimed at automatizing the synthesis of PSpice-like models able to reproduce both electrical and thermal dynamics is discussed, and a series of simulation issues are discussed.
Proceedings ArticleDOI

Electro-thermal model of Integrated Power Electronics Modules based on an innovative layered approach

TL;DR: An original methodology aimed at reducing an electro-thermal multi-domain problem to an electrical single-domain one thanks to a mapping between thermal and electrical quantities is described.
Proceedings ArticleDOI

Layered electro-thermal model of high-end integrated power electronics modules with IGBTs

TL;DR: A layered-approach methodology aimed at generating an IPEM model featuring six IGBT devices connected in a three-phase bridge topology is described and has as main objective the generation of a full-PSpice model of the IPEM able to take into account both the electrical and thermal behavior.
Proceedings ArticleDOI

Integrated power electronics modules: Electro-thermal modeling flow and stress conditions overview

TL;DR: In this article, a layered modeling flow able to take into account both the electrical and thermal behavior is detailed, and a series of issues able to produce prospective mechanical stresses and related failure conditions are discussed.