G
Gregory D. VanWiggeren
Researcher at Agilent Technologies
Publications - 57
Citations - 2021
Gregory D. VanWiggeren is an academic researcher from Agilent Technologies. The author has contributed to research in topics: Signal & Device under test. The author has an hindex of 17, co-authored 57 publications receiving 1928 citations. Previous affiliations of Gregory D. VanWiggeren include Georgia Institute of Technology & Georgia Tech Research Institute.
Papers
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Communication with Chaotic Lasers
TL;DR: The experimental demonstration of chaotic communication with an optical system is described, using an erbium-doped fiber ring laser to produce chaotic light and embedded in the larger chaotic carrier and transmitted to a receiver system where the message was recovered from the chaos.
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Optical Communication with Chaotic Waveforms
TL;DR: In this article, the authors proposed a high-dimensional chaotic carrier of information (HDCIA) for high-frequency communications, which can be recovered from the carrier using a receiver which is tuned to the dynamics of the transmitter.
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Synchronization of chaos in an array of three lasers
John R. Terry,K. Scott Thornburg,David J. DeShazer,Gregory D. VanWiggeren,Shiqun Zhu,Peter Ashwin,Rajarshi Roy +6 more
TL;DR: In this paper, the synchronization of three modulated Nd:YAG lasers oriented in a linear array with either a modulated pump or loss is investigated experimentally, numerically, and analytically.
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Chaotic communication using time-delayed optical systems
TL;DR: In this paper, the authors discuss experimental demonstrations of chaotic communication in several optical systems and demonstrate chaotic communications through 35 km of single-mode optical fiber at up to 250 Mbit/s, a rate that is, at present, limited only by the speed of their detector electronics.
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Single-scan interferometric component analyzer
TL;DR: In this paper, a novel interferometric method for characterizing optical components in the 1.5/spl mu/m communications band is described, and a complete polarization-resolved characterization of optical components is achieved with just one scan of a tunable laser.