Built-In-Test (BIT) for Radio Frequency (RF) integrated circuits can reduce
the testing cost, especially with the increase of integration level and operating frequency.
A fully integrated CMOS BIT detection circuit is presented in this work. This BIT
detection circuit is rectifier-based and low threshold voltage diode-connected MOS
transistor with substrate positively-biased is used to improve the detecting sensitivity.
As an example, a 2.4GHz LNA is used, the high frequency small signal gain is extracted
and the gain fluctuation due to Process, supply Voltage and Temperature (PVT)
variations is also investigated. The simulation results show that this BIT detection
circuit can realize on-chip functional verification of RF circuits and also monitor the
influence of PVT variations on the performance of the circuit without affecting the high
frequency performance of the measured RF circuits.

/pdf/a-built-in-test-circuit-for-functional-verification-pvt-1ja3y25h4z.pdf

A Built-In-Test Circuit for Functional Verification & PVT Variations Monitoring of CMOS RF Circuits

This paper expatiates the realization procession and key technology of neural network in fault diagnosis platform in detail, which combined with the realization of fault diagnosis platform based on neural network. Then we have carried on amiss control coding of the output cells in the deferent communication. So we have carried out mapping class once more of type and type of coding and carried out mapping class in reverse during the period of decoding. Using the theory and realization of intelligent BIT, we have gotten the development trend of fault diagnosis system, the use of neural network in intelligent BIT and the idiographic configuration of neural network in intelligent BIT, under the environment of hardware and software platform.

The Improved Research of Fault Diagnosis Algorithm in Intelligent BIT Design

The dynamic target echo intermediate-frequency signal source can be used to detecting and repairing receiving system, signal processing system, display system of conventional radar. The output frequency which conducted by the signal source can be adjusted. The range of output signal frequency basically covers different types of radar, which has important practical application value on the maintenance of radar. The dynamic target echo intermediate-frequency signal source is make up of source processing unit, intermediate-frequency unit, monitoring unit, the time reference source, input and output driver board and power supply pulse generation. Pulse processing unit in the signal source is in the core status.

The Design of Dynamic Target Echo Intermediate-Frequency Signal Source of Radar

This article analyze the transmitting characteristics of information in the modern And than, we find the basic design criterion of fault detection system in the complicated electronic devices. Than we discuss the possibility of achieving fault detection through a communication protocol. So we describe the design project of achieving detecting fault function through the communication protocol. At last, we brief introduce simulative detection function about fault detection circuit.

Distributed Fault Detection System Design Based on the Communication Protocol

Under the foundation of description of basic methods of fault diagnosis of analogy circuits, the qualitative analysis method using fault tree is introduced mainly. The qualitative analysis method using fault tree is a method between the method of simulation before test and simulation after test. The method includes the construction of fault tree in simulation before test and fault reason and search in simulation after test and other procedures. The most important step in the fault tree analysis method is the construction of fault tree. Only the fault tree is constructed correctly and reasonably can the true fault components be found.

http://ieeexplore.ieee.org/iel5/6261593/6272535/06272554.pdf

Research on test and diagnosis system of PCB based on VXIbus

The authors describe a vision of unambiguous fault isolation on RF equipment and enabling critical technologies. The overall goal is reduction of logistic support and maintenance cost of RF subsystems. Savings will be achieved through reduced false alarms, troubleshooting, false removal rates, spares inventory, and support equipment. The authors describe technology developments in miniature sources and signal analyzers with examples of built-in test (BIT) implementations utilizing specifically designed monolithic microwave integrated circuits (MMICs). These emerging technologies applied to integrated diagnostics can result in substantial cost avoidance in maintenance, spares inventory, and support equipment. >

H.M. Cronson

Papers

RE built-in test and enabling technologies for integrated diagnostics