Proceedings ArticleDOI
RE built-in test and enabling technologies for integrated diagnostics
A. Chu,H.M. Cronson,J.F. Devine,S. Soares,M.N. Soloman,Henri J. Lezec,Christian R. Musil +6 more
- pp 207-211
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TLDR
In this paper, the authors describe a vision of unambiguous fault isolation on RF equipment and enabling critical technologies, and the overall goal is reduction of logistic support and maintenance cost of RF subsystems.Abstract:
The authors describe a vision of unambiguous fault isolation on RF equipment and enabling critical technologies. The overall goal is reduction of logistic support and maintenance cost of RF subsystems. Savings will be achieved through reduced false alarms, troubleshooting, false removal rates, spares inventory, and support equipment. The authors describe technology developments in miniature sources and signal analyzers with examples of built-in test (BIT) implementations utilizing specifically designed monolithic microwave integrated circuits (MMICs). These emerging technologies applied to integrated diagnostics can result in substantial cost avoidance in maintenance, spares inventory, and support equipment. >read more
Citations
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Proceedings ArticleDOI
A Built-In-Test Circuit for Functional Verification & PVT Variations Monitoring of CMOS RF Circuits
TL;DR: Built-in-test (BIT) for radio frequency (RF) integrated circuits can reduce the testing cost, especially with the increase of integration level and operating frequency, and also monitor the influence of PVT variations on the performance of the circuit without affecting the high frequencyperformance of the measured RF circuits.
Proceedings ArticleDOI
The Improved Research of Fault Diagnosis Algorithm in Intelligent BIT Design
TL;DR: This paper expatiates the realization procession and key technology of neural network in fault diagnosis platform in detail, which combined with the realization of faultdiagnosis platform based on neural network, under the environment of hardware and software platform.
Journal ArticleDOI
The Design of Dynamic Target Echo Intermediate-Frequency Signal Source of Radar
TL;DR: The dynamic target echo intermediate-frequency signal source can be used to detecting and repairing receiving system, signal processing system, display system of conventional radar, and the range of output signal frequency basically covers different types of radar.
Journal ArticleDOI
Distributed Fault Detection System Design Based on the Communication Protocol
TL;DR: The basic design criterion of fault detection system in the complicated electronic devices is found and the design project of achieving detecting fault function through the communication protocol is described.
Proceedings ArticleDOI
Research on test and diagnosis system of PCB based on VXIbus
TL;DR: The qualitative analysis method using fault tree is a method between the method of simulation before test and simulation after test and other procedures that includes the construction of fault tree in simulation beforeTest and fault reason and search in simulation afterTest.
References
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The Six-Port Coupler: A New Approach to Measuring Voltage, Current, Power, Impedance, and Phase
TL;DR: In this article, a six-port coupler is described with four side arms whose outputs are proportional to the voltage, current, incident voltage wave, and reflected voltage wave at some desired measurement plane in the transmission line.
Journal ArticleDOI
A monolithic six-port module
TL;DR: The first fully monolithic microwave integrated circuit (MMIC) implementation of a complete six-port module is described in this article, which includes matched FET diode detectors, high-dynamic range logarithmic amplifiers, and tunable Gunn-effect oscillators.
Journal ArticleDOI
A tunable-frequency Gunn diode fabricated by focused ion-beam implantation
TL;DR: In this article, a planar Gunn diode with a focused beam of silicon ions and a linear doping-concentration gradient between the contacts was constructed by implanting the device with the focused ion beam and increasing the dose from contact to contact.
Proceedings ArticleDOI
Performance and applications of novel tunable oscillators utilizing focused-ion-beam-implanted Gunn-effect devices
A. Chu,L. Chu,W. Macropoulos,K. Khair,R. Patel,M. H. Cordaro,L.J. Mahoney,Henri J. Lezec,John Melngailis +8 more
TL;DR: In this paper, the authors demonstrate a family of dielectric resonator oscillators based on a single VCO design that operate in the frequency range from 8.26 to 13.85 GHz, for which the phase noise was -80 dBc/Hz at 100 kHz from the 9 GHz carrier.