H
H.M. Shang
Researcher at National University of Singapore
Publications - 89
Citations - 1407
H.M. Shang is an academic researcher from National University of Singapore. The author has contributed to research in topics: Speckle pattern & Shearography. The author has an hindex of 20, co-authored 88 publications receiving 1355 citations.
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Journal ArticleDOI
Shape measurement of small objects using LCD fringe projection with phase shifting
TL;DR: The method developed can also be applied to the measurement of the warp of a small component under thermal loading and is capable of conducting fully automated measurements.
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Microscopic surface contouring by fringe projection method
TL;DR: In this article, sinusoidal linear fringes are projected on a micro-component surface by a grating phase shifting projector and a long working distance microscope (LWDM), and the image of the fringe pattern is captured by a high-resolution camera and another LWDM and processed by phase-shifting technique.
Journal ArticleDOI
In situ surface roughness measurement using a laser scattering method
TL;DR: In this paper, an optical probe for in situ measurement of surface roughness is discussed. And the results obtained demonstrate the feasibility of using the proposed method using the suggested method on workpieces which were mounted on a turning machine that operates with different cutting speeds.
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Flaw detection in composites using time-average shearography
TL;DR: In this paper, the authors used time-average shearography to detect and size of flaws such as debonds or delaminations in glass fiber reinforced plastic beams, where the component has to be excited at the resonance frequencies of the flaws.
Journal ArticleDOI
Whole-field determination of surface roughness by speckle correlation.
TL;DR: A whole-field method of double-exposure Speckle photography is employed to determine metal surface roughness by correlation between two speckle patterns, which permits evaluation of the roughness of particular points on a surface as well as the average Roughness of an entire surface.