H
Hideo Sekiyama
Researcher at University of Tokyo
Publications - 4
Citations - 191
Hideo Sekiyama is an academic researcher from University of Tokyo. The author has contributed to research in topics: K-edge & Semiconductor. The author has an hindex of 3, co-authored 4 publications receiving 187 citations.
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Journal ArticleDOI
Sulfur K-edge absorption spectra of Na2SO4, Na2SO3, Na2S2O3, and Na2S2Ox(x=5―8)
TL;DR: In this paper, the X-ray absorption spectra of the sulfur K-edges of SO42−, SO32−, S2O32− and S2Ox2− were measured with synchrotron radiation.
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Design and performance of a UHV compatible soft X-ray double crystal monochromator at the proton factory
TL;DR: In this article, the design and performance of an ultrahigh vacuum compatible soft X-ray double crystal monochromator at the Photon Factory in operation is described, which is a compact version of the JUMBO at SSRL with some improved mechanisms.
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Effect of the Soft X-Ray Standing Wave Fields on the Total Electron Yield Spectra from an InP Crystal
TL;DR: In this paper, the electron emission modulated by a standing wave field from an InP (100) single crystal in the soft X-ray region was observed, and a remarkable difference of electron yield profiles was observed between below and above the P K edge.
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Investigation of the Si Oxidation Process by XANES Spectroscopy Using Synchrotron Radiation
TL;DR: In this article, the initial oxidation of Si(100) and Si(111) surfaces has been investigated using X-ray absorption near-edge structure spectroscopy using synchrotron radiation.