H
Hiroshi Iwamoto
Researcher at Hitachi
Publications - 27
Citations - 355
Hiroshi Iwamoto is an academic researcher from Hitachi. The author has contributed to research in topics: Network packet & Signal. The author has an hindex of 10, co-authored 26 publications receiving 355 citations.
Papers
More filters
Patent
Computer system having a plurality of computers each providing a shared storage access processing mechanism for controlling local/remote access to shared storage devices
Hideki Murayama,Yashiro Hiroshi,Satoshi Yoshizawa,Kazuo Horikawa,Takehisa Hayashi,Hiroshi Iwamoto,Kimitoshi Yamada +6 more
TL;DR: A computer system having a plurality of computers connected to each other by a computer coupling mechanism is a loosely coupled computer system as discussed by the authors, where each computer includes a processor, memory, I/O device, disk control mechanism, computer coupling network adapter, disk requirement processing section connected to a system bus, and a disk connected to disk controlled mechanism.
Patent
Fault recovering system provided in highly reliable computer system having duplicated processors
Hiroshi Ohguro,Koichi Ikeda,Takaaki Nishiyama,Hiroshi Iwamoto,Kenichi Kurosawa,Tetsuaki Nakamikawa,Michio Morioka +6 more
TL;DR: In this paper, the authors propose to duplicate processors, compare the outputs of the processors with each other and enhance the validity of the output of processor system, and save an internal state of the processor in amain memory and diagnosing factor of detected mismatch.
Patent
Large scale interconnecting switch using communication controller groups with multiple input-to-one output signal lines and adaptable crossbar unit using plurality of selectors
TL;DR: In this article, a large-scale interconnection switch with a switch arbiter for arbitrates switch setting requests for interconnection of the data processors from the communication controllers to output a switch setting control signal.
Patent
Processing/observing instrument
TL;DR: In this article, a SIM image of a processed cross section of a specimen without changing an angle of the specimen is obtained by using a focused ion beam irradiation (FIB) system.
Patent
Composite apparatus with secondary ion mass spectrometry instrument and scanning electron microscope
TL;DR: In this article, a composite apparatus consisting of a secondary ion mass spectrometry instrument and a scanning electron microscope is described, which includes a primary ion separating device which mass-separates the ion beam emitted from the ion source other than the liquid metal ion source.