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Hiroshi Yokoyama

Researcher at Kent State University

Publications -  468
Citations -  9540

Hiroshi Yokoyama is an academic researcher from Kent State University. The author has contributed to research in topics: Liquid crystal & Phase (matter). The author has an hindex of 46, co-authored 457 publications receiving 8999 citations. Previous affiliations of Hiroshi Yokoyama include Niigata University & Liquid Crystal Institute.

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Tristable nematic liquid-crystal device using micropatterned surface alignment

TL;DR: This work has demonstrated how bistability can be robustly engineered into a nematic LC device, by patterning a substrate with an orientational chequerboard pattern that enforces orthogonal LC alignment in neighbouring square domains, and extended this symmetry approach to obtain a tristable surface-aligned nematicLC.
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A novel method for determining the anchoring energy function at a nematic liquid crystal‐wall interface from director distortions at high fields

TL;DR: In this article, the anchoring energy function at the interface between 5CB(pentylcyanobiphenyl) and an obliquely evaporated SiO was determined by measuring the birefringence and the capacitance of a 56μm-thick cell up to 150 V rms at 0.23°C below the clearing temperature.
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Direct observation of anisotropic interparticle forces in nematic colloids with optical tweezers

TL;DR: This work introduces two different types of spatial distributions of forces, detected between the particles accompanied by hyperbolic hedgehog defects, which lead to specific particle arrangements, which are stabilized by the balance of the orientational stress field of nematics.
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Temperature-sensitive photoluminescence of CdSe quantum dot clusters.

TL;DR: Reversible luminescence intensity variations and spectral shifts of QD clusters show the potential for developing sensors based on QD nanoscale assemblies and reversible thermal trapping of electrons at inter-QD interfaces and dipole-dipole interactions in clusters.
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Role of space charge in scanned probe oxidation

TL;DR: In this article, the growth rate and electrical character of nanostructures produced by scanned probe oxidation are investigated by integrating an in situ electrical force characterization technique, scanning Maxwell-stress microscopy, into the fabrication process.