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Hiroyuki A. Sakaue

Researcher at National Institutes of Natural Sciences, Japan

Publications -  159
Citations -  2170

Hiroyuki A. Sakaue is an academic researcher from National Institutes of Natural Sciences, Japan. The author has contributed to research in topics: Ion & Electron beam ion trap. The author has an hindex of 23, co-authored 151 publications receiving 1935 citations. Previous affiliations of Hiroyuki A. Sakaue include Hiroshima University.

Papers
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Journal ArticleDOI

Resonant electron processes with open-shell highly charged ion targets

TL;DR: In particular, dielectronic recombination of a H-like ion has been observed by high-resolution x-ray spectroscopy for the first time as discussed by the authors, and the DR satellite spectra obtained in the present experiment are compared with theoretical spectra.
Patent

Liquid composition, process for producing the same, film of low dielectric constant, abradant and electronic component

TL;DR: A porous-structured diamond micrograin film known as a film of high heat resistance and low dielectric constant also exhibits high thermal conductivity and is promising as a multilayer wiring insulating film of semiconductor integrated circuit devices as mentioned in this paper.
Journal ArticleDOI

Interference between dielectronic and radiative recombination in electron - highly charged Bi collisions

TL;DR: In this article, the interference between radiative and dielectronic recombination in electron and highly charged Bi ion collisions has been studied by observing emitted x-rays with the Tokyo electron beam ion trap.
Patent

Low dielectric constant films and manufacturing method thereof, as well as electronic parts using the same

TL;DR: In this paper, a fine porous diamond particle film is treated with an aqueous solution of a salt of a metal such as barium and calcium, the carbonate or sulfate of which is insoluble or less soluble, and a hydrophobic agent such as hexamethyl disilazane or trimethyl monochlolo silane, as well as a reinforcing agent containing one of dichlorotetrameryl disiloxane or dimethoxytetramethyl disilloxane, thereby capable of putting the dielectric breakdown voltage and the