H
Hiroyuki Kamei
Researcher at Epson
Publications - 44
Citations - 523
Hiroyuki Kamei is an academic researcher from Epson. The author has contributed to research in topics: Piezoelectricity & Recording head. The author has an hindex of 10, co-authored 44 publications receiving 522 citations.
Papers
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Patent
Ink-jet recording head with piezoelectric device and method for manufacturing the same
TL;DR: In this paper, an ink jet print head that has a greater displacement at a low drive voltage was used to record the volume of the pressure chambers of an ink-jet print head.
Patent
Thin piezoelectric film element, process for the preparation thereof and ink jet recording head using thin piezoelectric film element
TL;DR: In this article, a PZT film was used as a vibrator for a high piezoelectric strain constant and a good adhesion with a lower electrode which can be produced without being cracked.
Patent
Ink jet recording head, method for manufacturing the same, and ink jet recorder
TL;DR: An ink jet recording head comprising a channel forming substrate (10) having a silicon layer of single crystal silicon in which a pressure generating chamber communicating with a nozzle opening is defined, and a piezoelectric element (300) provided in a region facing the pressure generating chambers (15) through a diaphragm constituting a part of the pressure generator and generating a pressure variation in the generator as discussed by the authors.
Patent
Piezoelectric body thin film element and manufacture thereof, and ink jet recording head employing piezoelectric body thin film element
TL;DR: In this paper, the authors proposed a method to construct a crystal structure of a rhombohedral system having a specific orientation on a piezoelectric body thin film by using an X ray diffraction film.
Journal ArticleDOI
Thickness dependence of structural and ferroelectric properties of sol-gel Pb(Zr0.56Ti0.44)0.90(Mg1/3Nb2/3)0.10O3 films
Kouji Sumi,H Qiu,Hiroyuki Kamei,Souichi Moriya,Masami Murai,Masato Shimada,Tsutomu Nishiwaki,K Takei,Satoru Miyashita,Mituru Hashimoto +9 more
TL;DR: In this paper, the structural and ferroelectric properties of PZT-PMN films were investigated as a function of film thickness by X-ray diffraction (XRD), scanning electron microscopy (SEM), and by measuring the relative permittivity.