H
Hyungsoo Kim
Researcher at KAIST
Publications - 62
Citations - 672
Hyungsoo Kim is an academic researcher from KAIST. The author has contributed to research in topics: Capacitor & Jitter. The author has an hindex of 15, co-authored 52 publications receiving 647 citations.
Papers
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Proceedings ArticleDOI
PCB power/ground plane edge radiation excited by high-frequency clock
TL;DR: In this article, the power/ground plane edge radiation was measured by TDR-TDT measurement and simulation with balanced TLM and via coupling model, and it was shown that the clock frequency and its harmonics go into the higher power and ground plane impedance range, the edge radiations increased by maximum 35 dBm in near field measurement.
Proceedings ArticleDOI
Modeling and simulation of IC and package power/ground network
TL;DR: With the modeling for broadband frequency region, the effect of each part in power/ground network on IC and package was analyzed in frequency domain and the modeling and simulation results about theIC and package power/ ground network have been depicted.
Proceedings ArticleDOI
A chip-package hybrid DLL loop and clock distribution network for low-jitter clock delivery
Daehyun Chung,Chunghyun Ryu,Hyungsoo Kim,Choonheung Lee,Jaedong Kim,Jin Young Kim,Kicheol Bae,Jiheon Yu,Seung-Jae Lee,Hoi-Jun Yoo,Joungho Kim +10 more
TL;DR: A chip-package hybrid DLL and clock distribution network provides low-jitter clock signals by utilizing separate supply connections and lossless package layer interconnections instead of on-chip global wires.
Proceedings ArticleDOI
Noise generation, coupling, isolation, and EM radiation in high-speed package and PCB
TL;DR: It is demonstrated that the via is a major source of the SSN (simultaneous switching noise) generation, coupling, and edge radiated emission in multi-layer packages and PCBs.
Proceedings ArticleDOI
The Improvement of Signal Integrity (SI) according to The Location of Via in The Vicinity of A Slot in The Reference Plane
TL;DR: The improved efficiency according to the location of via in the vicinity of slot is seen through simulation and measurement and the reduction of slot efficiency to provide isolation of a noise source from the rest of the PCB is shown.