I
Iosif Zeylikovich
Researcher at City University of New York
Publications - 51
Citations - 813
Iosif Zeylikovich is an academic researcher from City University of New York. The author has contributed to research in topics: Interferometry & Diffraction. The author has an hindex of 15, co-authored 51 publications receiving 782 citations. Previous affiliations of Iosif Zeylikovich include City College of New York & Fairfield University.
Papers
More filters
Journal ArticleDOI
Torsional Vibrational Modes of Tryptophan Studied by Terahertz Time-Domain Spectroscopy
TL;DR: The low-frequency torsional modes, index of refraction, and absorption of a tryptophan film and pressed powders were measured by terahertz time-domain spectroscopy at room temperature and it was found that there were two dominated torsial vibrational modes.
Patent
Performing selected optical measurements with optical coherence domain reflectometry
TL;DR: In this article, a system and method for performing selected optical measurements on a sample is provided utilizing an optical coherence domain reflectometer which includes a diffraction grating, where a broad band light source produces light having a short coherence length.
Patent
Systems and methods for non-destructively detecting material abnormalities beneath a coated surface
TL;DR: In this paper, a system for non-destructively detecting material abnormalities beneath a coated surface, comprising a mid-infrared (MIR) detection unit for illuminating an area of the coated surface and detecting light reflected from the illuminated area, and a processing unit for producing an image from optical characteristics received from the MIR detection unit.
Journal ArticleDOI
Ultrashort Laguerre-Gaussian pulses with angular and group velocity dispersion compensation
TL;DR: In this article, a reflective-mirror-based 4f-compressor is proposed to compensate the angular and group velocity dispersion of the ultrashort Laguerre-Gaussian (LG) pulses.
Journal ArticleDOI
Nonmechanical grating-generated scanning coherence microscopy
TL;DR: In this article, a novel method of coherence microscopy with a grating-generated delay line is demonstrated to produce depth-lateral images without axial or lateral scanning.