J
J. J. Ruz
Researcher at Spanish National Research Council
Publications - 25
Citations - 1121
J. J. Ruz is an academic researcher from Spanish National Research Council. The author has contributed to research in topics: Resonator & Cantilever. The author has an hindex of 11, co-authored 20 publications receiving 846 citations.
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Journal ArticleDOI
How two-dimensional bending can extraordinarily stiffen thin sheets.
TL;DR: In this article, a theory that describes the stiffness of curved thin sheets with simple equations in terms of the longitudinal and transversal curvatures was developed, which predicts experimental results with a macroscopic cantilever sheet as well as numerical simulations by the finite element method.
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Quantification of the surface stress in microcantilever biosensors: revisiting Stoney's equation.
TL;DR: An accurate and simple analytical expression to quantify the response of microcantilever biosensors is presented and exhibits an excellent agreement with finite element simulations and DNA immobilization experiments on gold-coated microCantilevers.
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Physics of Nanomechanical Spectrometry of Viruses
TL;DR: A detailed theoretical analysis is presented to calculate the resonance frequency shift induced by the mechanical stiffness of viral nanotubes, which opens the door to a novel paradigm for biological spectrometry as well as for measuring the Young's modulus of biological systems with minimal strains.
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Tackling reproducibility in microcantilever biosensors: a statistical approach for sensitive and specific end-point detection of immunoreactions
Priscila M. Kosaka,Javier Tamayo,J. J. Ruz,Sara Puertas,Ester Polo,Valeria Grazú,Jesús M. de la Fuente,Montserrat Calleja +7 more
TL;DR: The surface stress induced by the antibody-antigen binding is significantly correlated with the surface stress generated during the antibody attachment and blocking steps, enhancing the specificity and sensitivity of the assay.
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Spatially multiplexed dark-field microspectrophotometry for nanoplasmonics.
Valerio Pini,Priscila M. Kosaka,J. J. Ruz,Óscar Malvar,Mario Encinar,Javier Tamayo,Montserrat Calleja +6 more
TL;DR: The SMMS technique provides three orders of magnitude faster spectroscopic analysis than conventional dark-field microspectrophotometry, with the capability for mapping the spatial distribution of the scattered light intensity with lateral resolution of 40 nm over surface areas of 0.02 mm2.