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J. R. Waldrop

Researcher at Electronics Research Center

Publications -  2
Citations -  1131

J. R. Waldrop is an academic researcher from Electronics Research Center. The author has contributed to research in topics: Angle-resolved photoemission spectroscopy & Inverse photoemission spectroscopy. The author has an hindex of 1, co-authored 2 publications receiving 967 citations.

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Journal ArticleDOI

Precise Determination of the Valence-Band Edge in X-Ray Photoemission Spectra: Application to Measurement of Semiconductor Interface Potentials

TL;DR: In this article, a method for locating the valence-band edge in x-ray photo-emission spectra is reported. But this method is not suitable for measuring semiconductor interface potentials.
Book ChapterDOI

XPS STUDY OF GaAs (100) SURFACE OXIDE CHEMISTRY AND INTERFACE POTENTIAL

TL;DR: In this article, the authors used x-ray photoemission spectroscopy (XPS) to correlate chemistry, electrical potential, and charge at the native-oxide/GaAs interface (n-type material) as a function of various processing treatments.