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J. W. Braithwaite

Researcher at Sandia National Laboratories

Publications -  10
Citations -  255

J. W. Braithwaite is an academic researcher from Sandia National Laboratories. The author has contributed to research in topics: Copper & Copper sulfide. The author has an hindex of 5, co-authored 10 publications receiving 236 citations.

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Corrosion of Lithium‐Ion Battery Current Collectors

TL;DR: In this article, X-ray photoelectron spectroscopy analyses were used to characterize the corrosion behavior of aluminum and copper in a simulated ambient-temperature cycling in an excess of electrolyte.
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Nuclear waste canister corrosion studies pertinent to geologic isolation

TL;DR: In this article, the compatibility of candidate high-leve nuclear waste (HLW) canister materials with deep geologic isolation environments is addressed and results are presented which are applicable to both bedded salt and sub-seabed sediment repositories or test facilities.
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Determination of solid-state sulfidation mechanisms in ion-implanted copper

TL;DR: In this article, the influence of point defects and alloying elements on the sulfidation rate of copper films in atmospheric environments containing H 2 S was evaluated using ion implantation and ion irradiation.
ReportDOI

Mechanisms of Atmospheric Copper Sulfidation and Evaluation of Parallel Experimentation Techniques

TL;DR: In this paper, the authors examined the mechanisms of atmospheric copper sulfidation and evaluated new methods of parallel experimentation for high-throughput corrosion analysis, and found that the importance of various sulfidation mechanisms was determined as a function of relative humidity and sulfide thickness.
ReportDOI

A Modeling Approach for Predicting the Effect of Corrosion on Electrical-Circuit Reliability

TL;DR: In this article, an analytical capability is developed that can be used to predict the effect of corrosion on the performance of electrical circuits and systems, which will dramatically improve our ability to influence device and circuit design, address and remediate field occurrences, and determine real limits for circuit service life.