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Jack K. Wolf

Researcher at University of California, San Diego

Publications -  260
Citations -  15684

Jack K. Wolf is an academic researcher from University of California, San Diego. The author has contributed to research in topics: Decoding methods & Block code. The author has an hindex of 56, co-authored 260 publications receiving 15233 citations. Previous affiliations of Jack K. Wolf include University of Massachusetts Amherst & Bell Labs.

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Journal ArticleDOI

Binary communication over the Gaussian channel using feedback with a peak energy constraint

TL;DR: It is shown that the optimal probability of error is attainable without the use of the feedback channel by using antipodal signals, and the signal energy never exceeds a fixed level.
Journal ArticleDOI

Predicted performance of error-control techniques over real channels

TL;DR: A model is introduced that, in addition to having the ability to match error distributions, greatly simplifies the task of code evaluations and is shown to predict the results of tests of an interleaved burst-error-correcting code.
Journal ArticleDOI

Bounds on the capacity of a peak power constrained Gaussian channel

TL;DR: The authors present an upper bound and conjecture a lower bound on the information theoretic capacity of a digital magnetic recording channel as a linear time-invariant filter with a peak constrained input, and with additive non-white Gaussian noise at the output.
Journal ArticleDOI

Special hardware for computing the probability of undetected error for certain binary CRC codes and test results

TL;DR: A hardware device for efficiently evaluating the probability of undetected error for a class of CRC error detection codes with a large number of parity check digits is described and a search was conducted for codes in this class which are "proper" for shortened block lengths.
Proceedings ArticleDOI

On codes that correct asymmetric errors with graded magnitude distribution

TL;DR: This work adapts the analysis and code construction of Cassuto, et al. for the refined error model for multi-level flash memories, and assess the relative efficiency of the new codes.