This paper presents an active gate driver (AGD) for IGBT modules to improve their overall performance under normal condition as well as fault condition. Specifically, during normal switching transients, a di/dt feedback controlled current source and current sink is introduced together with a push-pull buffer for dynamic gate current control. Compared to a conventional gate drive strategy, the proposed one has the capability of reducing the switching loss, delay time, and Miller plateau duration during turn-on and turn-off transient without sacrificing current and voltage stress. Under overcurrent condition, it provides a fast protection function for IGBT modules based on the evaluation of fault current level through the di/dt feedback signal. Moreover, the AGD features flexible protection modes, which overcomes the interruption of converter operation in the event of momentary short circuits. A step-down converter is built to evaluate the performance of the proposed driving schemes under various conditions, considering variation of turn-on/off gate resistance, current levels, and short-circuit fault types. Experimental results and detailed analysis are presented to verify the feasibility of the proposed approach.

A di/dt Feedback-Based Active Gate Driver for Smart Switching and Fast Overcurrent Protection of IGBT Modules

Traction inverters are crucial components of modern electrified automotive powertrains. Advances in power electronics have enabled lower cost inverters with high reliability, efficiency, and power density, suitable for mass market consumer automotive applications. This paper presents an independent review of the state-of-the-art traction inverter designs from several production vehicles across multiple manufacturers. Future trends in inverter design are identified based on industry examples and academic research. Wide bandgap devices and trends in device packaging are discussed along with active gate driver implementations, current and future trends in system integration, and advanced manufacturing techniques.

Automotive Traction Inverters: Current Status and Future Trends

SiC MOSFETs exhibit extremely fast switching characteristics, which are unfortunately accompanied by undesirable switching oscillations. In this paper, equivalent circuit models incorporating all parasitic elements are developed for the turn-ON and turn-OFF of a SiC MOSFET. Simple mathematical formulas are derived to provide the theoretical analysis of the switching oscillation phenomenon, and to guide the snubber or damping circuit design. Both circuit simulation and experimental measurement are carried out to validate these simple equivalent circuit models.

Modeling and Analysis of SiC MOSFET Switching Oscillations

Active gate driving has been demonstrated to beneficially shape switching waveforms in Si- and SiC-based power converters. For faster GaN power devices with sub-10-ns switching transients, however, reported variable gate driving has so far been limited to altering a single drive parameter once per switching event, either during or outside of the transient. This paper demonstrates a gate driver with a timing resolution and range of output resistance levels that surpass those of existing gate drivers or arbitrary waveform generators. It is shown to permit active gate driving with a bandwidth that is high enough to shape a GaN switching during the transient. The programmable gate driver has integrated high-speed memory, control logic, and multiple parallel output stages. During switching transients, the gate driver can activate a near-arbitrary sequence of pull-up or pull-down output resistances between 0.12 and 64 Ω. A hybrid of clocked and asynchronous control logic with 150-ps delay elements achieves an effective resistance update rate of 6.7 GHz during switching events. This active gate driver is evaluated in a 1-MHz bridge-leg converter using EPC2015 GaN FETs. The results show that aggressive manipulation of the gate-drive resistance at sub-nanosecond resolutions can profile gate waveforms of the GaN FET, thereby beneficially shaping the switch-node voltage waveform in the power circuit. Examples of open-loop active gate driving are demonstrated that maintain the low switching loss of constant-strength gate driving, while reducing overshoot, oscillation, and EMI-generating high-frequency spectral content.

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A 6.7-GHz Active Gate Driver for GaN FETs to Combat Overshoot, Ringing, and EMI

This paper proposes a new concept for attaining a defined switching behavior of insulated-gate bipolar transistors (IGBTs) at inductive load (hard) switching, which is a key prerequisite for optimizing the switching behavior in terms of switching losses and electromagnetic interference (EMI). First, state-of-theart gate driver concepts that enable a control of the IGBT’s switching transients are reviewed. Thereafter, a highly dynamic closedloop IGBT gate driver using simple passive diC /dt and dvCE /dt feedbacks and employing a single analog PI-controller is proposed. Contrary to conventional passive gate drivers, this concept enables an individual control of the current and voltage slopes largely independent of the specific parameters or nonlinearities of the IGBT. Accordingly, a means for optimizing the tradeoff between switching losses, switching delay times, reverse recovery current of the freewheeling diode, turn-off overvoltage, and EMI is gained. The operating principle of the new gate driver is described and based on derived control oriented models of the IGBT, a stability analysis of the closed-loop control is carried out for different IGBT modules. Finally, the proposed concept is experimentally verified for different IGBT modules and compared to a conventional resistive gate driver.

Closed-Loop di/dt and dv/dt IGBT Gate Driver

As the characteristics of insulted gate transistors [like metal–oxide–semiconductor field-effect transistors and insulated gate bipolar transistors (IGBTs)] have been constantly improving, their utilization in power converters operating at higher and higher frequencies has become more common. However, this, in turn, leads to fast current and voltage transitions that generate large amounts of electromagnetic interferences over wide frequency ranges. In this paper, a new active gate voltage control (AGVC) method is presented. It allows us to control the values of at turn-on and at turn-off for insulated gate power transistors, by acting directly on the input gate voltage shape. In an elementary switching cell, it enables us to strongly reduce over-current generated by the reverse recovery of the free-wheeling diode at turn-on, and oscillations of the output voltage across the transistor at turn-off. In the following sections, the AGVC in open and closed-loop for IGBT is presented, and its performance is compared with that of a more conventional method, i.e., increasing the gate resistance. Robustness of the AGVC is estimated under variations of dc-voltage supply and transistor switched current.

Active gate voltage control of turn-on di/dt and turn-off dv/dt in insulated gate transistors

As the characteristics of insulted gate transistors (like metal-oxide-semiconductor field-effect transistors and insulated gate bipolar transistors (IGBTs)) have been constantly improving, their utilization in power converters operating at higher and higher frequencies has become more common. However, this, in turn, leads to fast current and voltage transitions that generate large amounts of electromagnetic interferences over wide fre- quency ranges. In this paper, a new active gate voltage control (AGVC) method is presented. It allows us to control the values of at turn-on and at turn-off for insulated gate power transistors, by acting directly on the input gate voltage shape. In an elementary switching cell, it enables us to strongly reduce over-current generated by the reverse recovery of the free-wheeling diode at turn-on, and oscillations of the output voltage across the transistor at turn-off. In the following sections, the AGVC in open and closed-loop for IGBT is presented, and its performance is compared with that of a more conventional method, i.e., increasing the gate resistance. Robustness of the AGVC is estimated under variations of dc-voltage supply and transistor switched current. Index Terms—Active gate voltage control (AGVC), electro- magnetic interference (EMI), insulated gate bipolar transistors (IGBTs), metal-oxide-semiconductor field-effect transistor (MOSFET).

Jean Jacques Franchaud

Papers

Active gate voltage control of turn-on di/dt and turn-off dv/dt in insulated gate transistors

Active Gate Voltage Control of Turn-on and Turn-off in Insulated Gate Transistors