J
Jean Vereecken
Researcher at Vrije Universiteit Brussel
Publications - 110
Citations - 2560
Jean Vereecken is an academic researcher from Vrije Universiteit Brussel. The author has contributed to research in topics: Aluminium & Auger electron spectroscopy. The author has an hindex of 29, co-authored 110 publications receiving 2402 citations. Previous affiliations of Jean Vereecken include Université libre de Bruxelles & Free University of Brussels.
Papers
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Effect of bath concentration and curing time on the structure of non-functional thin organosilane layers on aluminium
TL;DR: In this paper, the characterisation of bis-1,2-(triethoxysilyl)ethane (BTSE) thin layers has been evaluated by coupling optical techniques like spectroscopic ellipsometry (SE) and infra-red spectroscopy (IRSE) along with electrochemical methods (electrochemical impedance spectroopy (EIS) for better understanding of the protection provided by these organosilane thin films.
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Determination of the thickness of thin silane films on aluminium surfaces by means of spectroscopic ellipsometry
Alexis Franquet,J. De Laet,Tom Schram,Herman Terryn,Vijay Subramanian,W.J. van Ooij,Jean Vereecken +6 more
TL;DR: In this paper, the thickness of thin films of nonfunctional silane bis-1,2-(triethoxysilyl)ethane (H 5 C 2 O) 3 Si-CH 2 CH 2 -Si(OC 2 H 5 ) 3 (BTSE) deposited on aluminium surfaces is investigated using spectroscopic ellipsometry (250-1700 nm).
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Silane coating of metal substrates: Complementary use of electrochemical, optical and thermal analysis for the evaluation of film properties
TL;DR: In this article, a chemical and morphological characterisation of BTSE silane coated aluminium was performed using spectroscopic ellipsometry (SE) and electrochemical impedance spectroscopy (EIS).
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Electrochemical impedance spectroscopy in the presence of non-linear distortions and non-stationary behaviour Part I: theory and validation
E. Van Gheem,Rik Pintelon,Jean Vereecken,Joannes Schoukens,Annick Hubin,Peter Verboven,Orlin Blajiev +6 more
TL;DR: In this paper, a measurement method for electrochemical impedance spectroscopy (EIS) using specially designed broadband excitation signals is described, where the impedance, the disturbing noise, the level of non-linear distortions, and the non-stationary behaviour are simultaneously measured.
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Composition and thickness of non-functional organosilane films coated on aluminium studied by means of infra-red spectroscopic ellipsometry
TL;DR: In this paper, the chemistry of the deposited silane films has been studied as a function of the silane bath concentration, which is a method similar to reflection absorption infra red spectroscopy (RAIRS).