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Jeng-Shyang Pan

Researcher at Shandong University of Science and Technology

Publications -  889
Citations -  14887

Jeng-Shyang Pan is an academic researcher from Shandong University of Science and Technology. The author has contributed to research in topics: Digital watermarking & Computer science. The author has an hindex of 50, co-authored 789 publications receiving 11645 citations. Previous affiliations of Jeng-Shyang Pan include National Kaohsiung Normal University & Technical University of Ostrava.

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Journal ArticleDOI

Correction to: Improved DV-Hop based on parallel and compact whale optimization algorithm for localization in wireless sensor networks

TL;DR: The article ‘‘Improved DV-Hop based on parallel and compact whale optimization algorithm for localization in wireless sensor networks’’, written by Ruo-Bin Wang, Wei-Feng Wang, Lin Xu, Jeng-Shyang Pan and Shu-Chuan Chu, was originally published online on the publisher’s internet portal with Open Access.
Journal ArticleDOI

A More Robust Subsampling-Based Image Watermarking

TL;DR: A novel subsampling based image watermark sequentially embedding scheme to reduce the risk of common permutation attack and experimental results also show its effectiveness and robustness.
Proceedings ArticleDOI

Bilinear Feature Line Analysis for Face Recognition

TL;DR: A novel Bilinear Feature Line Analysis (BFLA) is proposed for image feature extraction in this letter, which aims to minimize the within class scatter based on two-dimensional NFL.
Proceedings ArticleDOI

A Novel Classifier Based on Nearest Feature Line

TL;DR: To improve the miss-classification of nearest feature line when the prototypes in NFL are far away from the query sample, restricted nearest featureline with angle uses the angle between two lines to restrict the feature lines.
Proceedings ArticleDOI

A SCADA system for on-line battery early faults precaution

TL;DR: In this article, a critical on-line analysis of trace resistance method and trace voltage method through the SCADA system application is presented, which can be used to find the early faults of the batteries.