J
Jerome Kruger
Researcher at National Institute of Standards and Technology
Publications - 39
Citations - 878
Jerome Kruger is an academic researcher from National Institute of Standards and Technology. The author has contributed to research in topics: Corrosion & Oxide. The author has an hindex of 16, co-authored 39 publications receiving 856 citations.
Papers
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Journal ArticleDOI
Ellipsometric‐Potentiostatic Studies of Iron Passivity I . Anodic Film Growth in Slightly Basic Solutions
Jerome Kruger,Joan P. Calvert +1 more
Journal ArticleDOI
Optical Constants of Iron in the Visible Region
H. T. Yolken,Jerome Kruger +1 more
TL;DR: In this article, the optical constants of clean iron single-crystal surfaces maintained in an ultrahigh vacuum were determined using an ellipsometric technique to determine values of optical constants as a function of wavelength in the region of 3600-7000 A.
Journal ArticleDOI
Room Temperature Oxidation of Iron at Low Pressures
Jerome Kruger,H. T. Yolken +1 more
TL;DR: In this article, the early stages of the oxidation process followed a linear growth law with rate being proportional to the pressure, and the sticking probability of oxygen in the pressure range studied was of the order of 5 × 10−3 Traces of water vapor lowered the limiting film thickness approached in the latter, nonlinear, oxidation stage to 18 A from the 26 A found at all pressures for dry oxygen.
Journal ArticleDOI
Studies of passive film breakdown by detection and analysis of electrochemical noise
U. Bertocci,Jerome Kruger +1 more
TL;DR: In this paper, random fluctuations in the passive current of electrodes under potentiostatic conditions have been measured on aluminum in boric acid: borate solution and on a Fe-Cr-Ni alloy, both in the amorphous and in the crystalline state, in sulfuric acid.
Journal ArticleDOI
Optical Studies of the Formation and Breakdown of Passive Films Formed on Iron Single Crystal Surfaces in Inorganic Inhibitor Solutions
TL;DR: In this paper, polarized light was used to measure the thickness and optical properties of passive films as they were forming while simultaneous electrochemical measurements were being made, and film formation studies showed that a change in film thickness of 15-20Aa was associated with the onset of a passive potential.