Head-worn adaptive display

An eyepiece includes a mechanical frame adapted to secure a lens and an image source facility above the lens. The image source facility includes an LED, a planar illumination facility and a reflective display. The planar illumination facility converts a light beam from the LED received on a side of the planar illumination facility into a top emitting planar light source, uniformly illuminates the reflective display, and is substantially transmissive to allow reflected light to pass through towards a beam splitter. The beam splitter is positioned to receive the image light and to reflect a portion onto a mirrored surface. The mirrored surface is positioned and shaped to reflect the image light into an eye of a user of the eyepiece thereby providing an image within a field of view, the mirrored surface further adapted to be partially transmissive within an area of image reflectance.

Eyepiece with uniformly illuminated reflective display

See-through display with an optical assembly including a wedge-shaped illumination system

A three-dimensional imaging system includes a two-dimensional array (230) of pixel light sensing detectors and dedicated electronics and associated processing circuitry fabricated on a common IC (210) using CMOS fabrication techniques. In one embodiment, each detector (240) has an associated high speed counter (250) that accumulates clock pulses in number directly proportional to time of flight (TOF) for a system-emitted pulse to reflect from an object point and be detected by a pixel detector focused upon that point. The TOF data provides a direct digital measure of distance from the particular pixel to a point on the object reflecting the emitted light pulse. In a second embodiment, the counters and high speed clock circuits are eliminated, and instead each pixel detector (240) is provided with a charge accumulator (600) and an electronic shutter (SI) such that each pixel detector accumulates charge, the amount of which provides a direct measure of round-trip TOF.

Cmos-compatible three-dimensional image sensor ic

An interactive head-mounted eyepiece with an integrated processor for handling content for display and an integrated image source for introducing the content to an optical assembly through which the user views a surrounding environment and the displayed content, wherein the height of the image source is at least 80% of a display active area width of the optical assembly.

See-through near-eye display glasses with a small scale image source

A laser pattern inspection and/or writing system which writes or inspects a pattern on a target on a stage, by raster scanning the target pixels. An autofocus keeps the scanning laser beam in focus on the target. The autofocus system includes an objective lens assembly through which a first laser beam is directed onto a writing surface, an autofocus laser which is detected by a photodetector after it is reflected from the surface of a target, and a linear magnetic motor for moving a lens in the objective lens assembly to keep the first laser beam focused on the writing surface.

Autofocus system for scanning laser inspector or writer

A laser pattern inspection and/or writing system which writes or inspects a pattern on a target on a stage, by raster scanning the target pixels. Inspection can also be done by substage illumination with non-laser light. A database, organized into frames and strips, represents an ideal pattern as one or more polygons. Each polygon's data description is contained within a single data frame. The database is transformed into a turnpoint polygon representation, then a left and right vector representation, then an addressed pixel representation, then a bit-mapped representation of the entire target. Most of the transformations are carried out in parallel pipelines. Guardbands around polygon sides are used for error filtering during inspection. Guardbands are polygons, and frames containing only guardband information are sent down dedicated pipelines. Error filtering also is done at the time of pixel comparisons of ideal with real patterns, and subsequently during defect area consolidation. Defect areas are viewed as color overlays of ideal and actual target areas, from data generated during real time. Defect areas can be de-zoomed to allow larger target areas to be viewed. An autofocus keeps the scanning laser beam in focus on the target. The inspection system is used to find fiducial marks to orient the target prior to raster scanning. IC bars are provided with alignment marks for locating each IC bar. Interferometers or glass scale encoders allow the stage position to be known.

Pattern comparator with substage illumination and polygonal data representation

Integrated circuit including light source,photodiode and associated components

A laser pattern inspection and/or writing system which writes or inspects a pattern on a target on a stage, by raster scanning the target pixels. Inspection can also be done by substage illumination with non-laser light. A database, organized into frames and strips, represents an ideal pattern as one or more polygons. Each polygon's data decription is contained within a single data frame. The database is transformed into a turnpoint polygon representation, then a left and right vector representation, then an addressed pixel representation, then a bit-mapped representation of the entire target. Most of the transformations are carried out in parallel pipelines. Guardbands around polygon sides are used for error filtering during inspection. Guardbands are polygons, and frames containing only guardband information are sent down dedicated pipelines. Error filtering also is done at the time of pixel comparisons of ideal with real patterns, and subsequently during defect area consolidation. Defect areas are viewed as color overlays of ideal and actual target areas, from data generated during real time. Defect areas can be de-zoomed to allow larger target areas to be viewed. An autofocus keeps the scanning laser beam in focus on the target. The inspection system is used to find fiducial marks to orient the target prior to raster scanning. IC bars are provided with alignment marks for locating each IC bar. Interferometers or glass scale encoders allow the stage position to be known.

Jerry D Merryman

Papers

Autofocus system for scanning laser inspector or writer

Pattern comparator with substage illumination and polygonal data representation

Integrated circuit including light source,photodiode and associated components

Position compensation of laser scan for stage movement

Color display system