A self-testable and highly reliable low noise amplifier designed in 0.13 m CMOS technology is presented in this paper. This reliable LNA could be used to design the front-end of critical nodes in wireless local area networks to ensure data transmission. The LNA test, based on a built-in self test methodology, monitors its behavior. The test circuit is composed of one sensor and one biasing voltage sensor, and it offers high fault coverage. The high reliability is ensured by the use of redundancies. The LNA works under a 0.9 V supply voltage and the test chip has RF characteristics suitable for 802.11b/g applications. Parametric faults are injected and detected to demonstrate the efficiency of the BIST circuitry. Thanks to the switching on redundant blocks, performances are maintained and hence this proves the reliability of the methodology proposed.

Design of a 0.9 V 2.45 GHz Self-Testable and Reliability-Enhanced CMOS LNA

Customers of industrial system/machines are becoming increasingly focused on life cycle performance of products for their purchase decisions. Manufacturers of such type of products, for example machine tools, are experiencing increased pressure from customers to deliver customised products with documented reliability, maintainability, maintenance and support characteristics and also with minimum environmental impacts. In this article, first the problem has been explored in the context of Indian machine tool industry and also from literature perspective. Some of the important issues are listed and research steps are identified to address these issues.

https://web.iitd.ac.in/~mskulkarni/Papers/Bhupesh/BL_2008_IJPLM.pdf

Integrated reliability and optimal maintenance schedule design : a Life Cycle Cost based approach

Integrated Stateflow-based simulation modelling and testability evaluation for electronic built-in-test (BIT) systems

Jiajun Shao

Papers

Impact of BIT design parameters on systems RAM

Reliability model of cold standby systems with built-in-test

Markov model for k-out-of-n:G systems with built-in-test