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Jici Wen

Researcher at Chinese Academy of Sciences

Publications -  11
Citations -  154

Jici Wen is an academic researcher from Chinese Academy of Sciences. The author has contributed to research in topics: Computer science & Battery (electricity). The author has an hindex of 4, co-authored 5 publications receiving 73 citations.

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Stress evolution in elastic-plastic electrodes during electrochemical processes: A numerical method and its applications

TL;DR: In this article, a robust electrochemical-mechanical coupled numerical procedure was developed to investigate the influence of large plastic deformation and interfacial failure on the measured stress in thin film electrodes.
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Anisotropic expansion and size-dependent fracture of silicon nanotubes during lithiation

TL;DR: In this article, the authors investigated the fracture and expansion behavior of crystalline silicon nanotubes, and the influences of the crystal phase, crystal orientation, inner radius, wall thickness, and thickness-radius ratio were demonstrated.
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Physics-driven machine learning model on temperature and time-dependent deformation in lithium metal and its finite element implementation

TL;DR: In this article, a physics-driven machine learning (PD-ML) algorithm is proposed to map the temperature, stress and rate-dependent deformation in Li-metal anode.
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Examining the validity of Stoney-equation for in-situ stress measurements in thin film electrodes using a large-deformation finite-element procedure

TL;DR: In this article, the Stoney equation was used to estimate the stress in thin-film electrodes during deformation and lithiation. But, the authors pointed out that both the variation in elastic properties and finite-deformation during thin film electrodes and finite deformation during lithiation and delithiation would challenge the applicability of Stoney-equation for in-situ stress measurements.
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Linear correlation between state-of-health and incremental state-of-charge in Li-ion batteries and its application to SoH evaluation

TL;DR: In this article , an analysis based on a partial discharge and a sliding voltage window on the constant-current (dis)charge voltage-time curve may fulfill the need to supply a quick, non-destructive, and preferably on-site assessment of SoH with high fidelity.