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Jie Chen

Researcher at Chinese Academy of Sciences

Publications -  9
Citations -  336

Jie Chen is an academic researcher from Chinese Academy of Sciences. The author has contributed to research in topics: Coating & Microstructure. The author has an hindex of 8, co-authored 9 publications receiving 267 citations.

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Tribological properties of adaptive NiCrAlY–Ag–Mo coatings prepared by atmospheric plasma spraying

TL;DR: In this paper, an adaptive NiCrAlY-Ag-Mo composite coating was deposited by atmospheric plasma spraying and its tribological properties from 20°C to 800°C under unlubricated conditions were evaluated using CSM high temperature tribometer.
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Microstructure and tribological properties of iron-based metallic glass coatings prepared by atmospheric plasma spraying

TL;DR: In this article, the morphology, microstructure, and crystalline structure of as-prepared Fe-based metallic glass coatings were analyzed by scanning electron microscopy, transmission electron microscope, and X-ray diffraction.
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Structure and corrosion behavior of iron-based metallic glass coatings prepared by LPPS

TL;DR: In this paper, the microstructural characteristics of the spraying powders and as-sprayed coatings were studied using X-ray diffraction (XRD), differential scanning calorimetry (DSC), and scanning electron microscopy (SEM).
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Composition versus friction and wear behavior of plasma sprayed WC–(W,Cr)2C–Ni/Ag/BaF2–CaF2 self-lubricating composite coatings for use up to 600 °C

TL;DR: In this article, an atmospheric plasma spraying (APS) system was used to deposit promising WC-(W,Cr)2C-Ni/Ag/BaF2-CaF2 self-lubricating composite coatings.
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Microstructure and high-temperature friction and wear behavior of WC-(W,Cr)2C-Ni coating prepared by high velocity oxy-fuel spraying

TL;DR: In this article, the microstructure and phase composition of WC-(W,Cr) 2 C-Ni composite powder were analyzed by means of scanning electron microscopy (SEM), field emission scanning electron microscope (FESEM), X-ray diffraction (XRD), and transmission electron microscope (TEM).