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Jing Wang

Researcher at University of Electronic Science and Technology of China

Publications -  23
Citations -  90

Jing Wang is an academic researcher from University of Electronic Science and Technology of China. The author has contributed to research in topics: Laser & Birefringence. The author has an hindex of 5, co-authored 19 publications receiving 56 citations.

Papers
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Simultaneous mapping of reflectance, transmittance and optical loss of highly reflective and anti-reflective coatings with two-channel cavity ring-down technique.

TL;DR: The use of a two-channel cavity ring-down (CRD) technique for simultaneously measuring/mapping the reflectance R, transmittance T and optical loss L of highly reflective (HR) and anti-reflective (AR) laser components is demonstrated.
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Sensitive measurement of stress birefringence of fused silica substrates with cavity ring-down technique.

TL;DR: The experimental results demonstrated that cavity ring-down is a sensitive technique for stress birefringence measurements of optical components and was in good agreement with that measured with a commercial stress bifringence measurement instrument.
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Temperature- and Size-Dependent Exciton Dynamics in PbS Colloidal Quantum Dot Thin Films Using Combined Photoluminescence Spectroscopy and Photocarrier Radiometry

TL;DR: In this paper, the authors applied the combined PL temperature spectra and PCR temperature and frequency measurements to PbS CQD thin films capped with oleic acid and found enhanced PL intensities at high temperatures originating in thermally activated exciton transfer from trap to exciton states.
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Theoretical analysis and test for off-axis Cassegrain optical antenna

TL;DR: In this article, a detailed analysis of Cassegrain optical antenna with inclined optical axis, the receiving antenna power and the curve of power attenuation are obtained for different deflection angles.
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Nonlinear two-layer model for photocarrier radiometry of ion-implanted silicon wafers

TL;DR: In this paper, a nonlinear two-layer model was developed to describe and analyze Photocarrier Radiometric (PCR) signals of ion-implanted Si wafers which are intrinsically nonlinear with excitation laser power.