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Jiří Nohava

Researcher at Czech Technical University in Prague

Publications -  11
Citations -  183

Jiří Nohava is an academic researcher from Czech Technical University in Prague. The author has contributed to research in topics: Indentation & Nanoindentation. The author has an hindex of 5, co-authored 7 publications receiving 157 citations. Previous affiliations of Jiří Nohava include École Centrale Paris.

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Electron backscattering diffraction analysis of secondary cleavage cracks in a reactor pressure vessel steel

TL;DR: In this article, secondary cleavage cracks in the A 508 C1.3 bainitic steel were analyzed using electron backscattering diffraction (EBSD) and scanning electron microscopy (SEM).
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On the identification of stress–strain relation by instrumented indentation with spherical indenter

TL;DR: In this paper, the authors characterized local stress-strain relations by instrumented indentation with spherical indenter and compared the results obtained by indentations with different indenter radii with tensile stressstrain curves of two metastable austenitic stainless steels.
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Comparison of Isolated Indentation and Grid Indentation Methods for HVOF Sprayed Cermets

TL;DR: In this article, the results of two approaches of instrumented indentation for characterization of mechanical properties of HVOF coatings were compared by means of isolated nanoindentation and grid indentation methods.
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Characterisation of strain‐induced martensite in a metastable austenitic stainless steel by nanoindentation

TL;DR: In this article, a grid nanoindentation method was used to characterise deformation-induced martensite in metastable austenitic steel, which was verified by independent phase identification using electron back scattered diffraction.
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Characterization of Anisotropy in Hardness and Indentation Modulus by Nanoindentation

TL;DR: In this paper, the authors applied the grid indentation method on an area containing several grains with different crystallographic orientation, which was simultaneously characterized by electron back-scatter diffraction.