J
John J. Rehr
Researcher at University of Washington
Publications - 356
Citations - 28335
John J. Rehr is an academic researcher from University of Washington. The author has contributed to research in topics: Extended X-ray absorption fine structure & Scattering. The author has an hindex of 60, co-authored 346 publications receiving 26135 citations. Previous affiliations of John J. Rehr include Yeshiva University & Los Alamos National Laboratory.
Papers
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Journal ArticleDOI
Real-space multiple-scattering calculation and interpretation of x-ray-absorption near-edge structure
TL;DR: In this paper, a selfconsistent real-space multiple-scattering (RSMS) approach for calculations of x-ray-absorption near-edge structure (XANES) is presented and implemented in an ab initio code applicable to arbitrary aperiodic or periodic systems.
Journal ArticleDOI
Theoretical approaches to x-ray absorption fine structure
John J. Rehr,R. C. Albers +1 more
TL;DR: In this paper, the authors focus on extended x-ray absorption fine structure (EXAFS) well above an X-ray edge, and, to a lesser extent, on xray absorption near-edge structure (XANES) closer to an edge.
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Multiple-scattering calculations of x-ray-absorption spectra
TL;DR: A high-order multiple-scattering approach to the calculation of polarized x-ray-absorption spectra, which includes both x- Ray- absorption fine structure and x-Ray- absorption near-edge structure, is presented.
Journal ArticleDOI
Theoretical X-ray Absorption Fine Structure Standards
John J. Rehr,John J. Rehr,J. Mustre de Leon,S. I. Zabinsky,S. I. Zabinsky,R. C. Albers,R. C. Albers +6 more
Journal ArticleDOI
High-order multiple-scattering calculations of x-ray-absorption fine structure.
TL;DR: High-order scattering is found to be essential for the convergence of the multiple-scattering (MS) theory of x-ray-absorption fine structure, both in the near-edge and the extended regimes.