J
John L. Workman
Researcher at National Institute of Standards and Technology
Publications - 2
Citations - 82
John L. Workman is an academic researcher from National Institute of Standards and Technology. The author has contributed to research in topics: Insertion loss & Electromagnetic compatibility. The author has an hindex of 2, co-authored 2 publications receiving 81 citations.
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Expanding the Bandwidth of TEM Cells for EMC Measurements
TL;DR: In this paper, a modified transverse electromagnetic TEM cell with expanded bandwidth for use in accurately characterizing electromagnetic interference (EMI) fields within a shielded environment is presented. Butler et al. used the cell to evaluate the radiated emissions from a common electronic module (microprocessor timing circuit).
Journal ArticleDOI
Generation of EM Susceptibility Test Fields Using a Large Absorber-Loaded TEM Cell
TL;DR: In this article, the authors describe the development of an electromagnetic simulator for accurate generation of broadband suspectibility test fields within a shielded environment, which consists of a large, 3 m X 3m X 6 m, rectangular transverse electromagnetic (TEM) transmission cell that is loaded with RF absorber to suppress multimoding at frequencies above the cell's waveguide cutoff or resonant frequencies.