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Jordi Sancho-Parramon

Researcher at University of Barcelona

Publications -  90
Citations -  1304

Jordi Sancho-Parramon is an academic researcher from University of Barcelona. The author has contributed to research in topics: Thin film & Plasmon. The author has an hindex of 20, co-authored 78 publications receiving 1072 citations.

Papers
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Dark modes and Fano resonances in plasmonic clusters excited by cylindrical vector beams.

TL;DR: The results show the potential of CVB to tailor the plasmonic response of nanoparticle clusters in a unique way.
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Hollow metal nanostructures for enhanced plasmonics: synthesis, local plasmonic properties and applications

TL;DR: In this paper, the authors summarize the efforts on the synthesis of hollow metal nanostructures with an emphasis on the galvanic replacement reaction and discuss the advancements on the characterization of plasmonic properties of hollow nanostructure, covering the single nanoparticle experiments, nanoscale characterization via electron energy-loss spectroscopy and modeling and simulation studies.
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Relation between 2D/3D chirality and the appearance of chiroptical effects in real nanostructures.

TL;DR: The optical activity of fabricated metallic nanostructures is investigated by complete polarimetry and it is shown that subtle planar dissymmetries in gammadia are sufficient to generate asymmetric transmission of circular polarized light.
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Surface plasmon resonance broadening of metallic particles in the quasi-static approximation: a numerical study of size confinement and interparticle interaction effects.

TL;DR: It is shown that for noble metals the contribution of interparticle interaction to plasmon resonance width cannot be neglected even at volume concentrations of a few per cent.
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Optical properties of gold island films : a spectroscopic ellipsometry study

TL;DR: In this article, the optical properties of gold metal island films with different mass thicknesses at different substrate temperatures were studied. But the optical characterization is performed by spectroscopic ellipsometry at different angles of incidence and transmittance measurements at normal incidence in the same point of the sample.