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Joshua W. Baron

Researcher at HRL Laboratories

Publications -  21
Citations -  160

Joshua W. Baron is an academic researcher from HRL Laboratories. The author has contributed to research in topics: Pattern matching & Secure multi-party computation. The author has an hindex of 6, co-authored 21 publications receiving 150 citations. Previous affiliations of Joshua W. Baron include University of California, Los Angeles.

Papers
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Book ChapterDOI

5PM: secure pattern matching

TL;DR: The techniques reduction pattern matching and generalized Hamming distance problem to a novel linear algebra formulation that allows for generic solutions based on any additively homomorphic encryption are believed to be of independent interest.
Journal ArticleDOI

5PM: Secure pattern matching

TL;DR: The problem of secure pattern matching that allows single-character wildcards and substring matching in the malicious stand-alone setting is considered and the first secure expressive pattern matching protocol designed to optimize round complexity by carefully specifying the entire protocol round by round is considered.
Patent

Secure pattern matching

TL;DR: In this article, a secure pattern matching protocol was proposed, where the first set of processors sends an encrypted matrix to the second set of processor, and the second processor decodes the matrix and sends the final activation vector to the first processor.
Patent

General protocol for proactively secure computation

TL;DR: In this paper, a system for proactively secure multi-party computation (MPC) is described, where secret shares representing data are constructed to perform computations between a plurality of parties modeled as probabilistic polynomial-time interactive Turing machines.
Proceedings ArticleDOI

Performance Limitations of Compressive Sensing for Millimeter Wave Imaging

TL;DR: In this article, the authors present an analysis of compressive sensing as applied to millimeter wave and optical imaging systems, showing that the technique inherently reduces detection efficiency due to reflection and diffraction effects of the underlying electromagnetics.