J
Jussi-Pekka Jansson
Researcher at University of Oulu
Publications - 20
Citations - 291
Jussi-Pekka Jansson is an academic researcher from University of Oulu. The author has contributed to research in topics: Laser diode & Laser. The author has an hindex of 7, co-authored 20 publications receiving 179 citations.
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Journal ArticleDOI
Synchronization in a Multilevel CMOS Time-to-Digital Converter
TL;DR: This paper suggests some solutions using a time-to-digital converter architecture based on two-level interpolation as a test vehicle, which demonstrates 6-ps rms single-shot precision in a measurement range of 1 ms.
Journal ArticleDOI
A CMOS Receiver–TDC Chip Set for Accurate Pulsed TOF Laser Ranging
TL;DR: An integrated receiver–time-to-digital converter (TDC) chip set is developed for pulsed time-of-flight (TOF) laser rangefinding and measurement accuracy of ~ ±3 mm was achieved with noncooperative targets at a distance range of a few tens of meters within an amplitude range of received echoes of 1:40 000.
Journal ArticleDOI
A 32 × 128 SPAD-257 TDC Receiver IC for Pulsed TOF Solid-State 3-D Imaging
TL;DR: The receiver IC was designed to be used in a solid-state 3-D imaging system with laser illumination concentrated in both time (short sub-ns pulses) and space (targeting only the active rows of the SPAD array).
Proceedings ArticleDOI
A single chip laser radar receiver with a 9×9 SPAD detector array and a 10-channel TDC
TL;DR: A single chip receiver for pulsed laser time-of-flight rangefinding applications has been realized in a standard 0.35um HV CMOS technology and functional tests in a laser radar environment indicate full functionality over a range of nearly 80 metres.
Journal ArticleDOI
Solid-state 3D imaging using a 1nJ/100ps laser diode transmitter and a single photon receiver matrix
TL;DR: A 3D imaging concept based on pulsed time- of-flight focal plane imaging is presented which can be tailored flexibly in terms of performance parameters such as range, image update rate, field-of-view, 2D resolution, depth accuracy, etc. according to the needs of different applications.