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Jyrki Räisänen

Researcher at University of Helsinki

Publications -  274
Citations -  4160

Jyrki Räisänen is an academic researcher from University of Helsinki. The author has contributed to research in topics: Ion & Thin film. The author has an hindex of 30, co-authored 271 publications receiving 3726 citations. Previous affiliations of Jyrki Räisänen include Hungarian Academy of Sciences & University of Eastern Finland.

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Atomic Layer Deposition of Rhenium Disulfide.

TL;DR: The developed ReS2 ALD process highlights the potential of the material for applications beyond planar structure architectures and offers a route to an upgrade to an industrial scale.
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Measurements of relative thick target yields for PIGE analysis on light elements in the proton energy interval 2.4–4.2 MeV

TL;DR: In this article, the authors extend the energy range of the systematic investigation on relative thick target yields performed by ANTTILA et al. for 1.4≤Ep≤4.2 MeV and discuss the results from the point of view of PIGE analysis.
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Atomic Layer Deposition of Crystalline MoS2 Thin Films: New Molybdenum Precursor for Low‐Temperature Film Growth

TL;DR: In this article, atomic layer deposition (ALD) is used to deposit crystalline Molybdenum disulfide (MoS2) thin films at a relatively low temperature of 300 °C.
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Thermal Atomic Layer Deposition of Continuous and Highly Conducting Gold Thin Films

TL;DR: In this paper, five Au(III) compounds were synthesized and evaluated for atomic layer deposition of Au thin films, and one of them, Me2Au(S2CNEt2), showed optimal thermal characteristics while being volatile and thermally stable.
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Proton-induced thick-target gamma-ray yields for the elemental analysis of the z = 3-9, 11-21 elements

TL;DR: In this article, a systematic study of the relative thick target yields of prompt γ-rays following proton bombardment has been carried out at Ep=1, 1.7 and 2.4 MeV for the elements Z=3-9, 11-21.