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K. Venkateswaran

Researcher at CMR Institute of Technology

Publications -  19
Citations -  86

K. Venkateswaran is an academic researcher from CMR Institute of Technology. The author has contributed to research in topics: Contourlet & k-means clustering. The author has an hindex of 5, co-authored 18 publications receiving 51 citations. Previous affiliations of K. Venkateswaran include Kongu Engineering College & University of Colorado Boulder.

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Journal ArticleDOI

Evaluation of electromagnetic intrusion in brushless DC motor drive for electric vehicle applications with manifestation of mitigating the electromagnetic interference

TL;DR: The predominant discrimination of an electric vehicle from the conventional gas vehicle is the use of suitable electric drive system as discussed by the authors, which introduces new elements such as inverters, electric motors, etc.
Proceedings ArticleDOI

A survey on unsupervised change detection algorithms

TL;DR: A systematic survey of the commonly used methodologies for unsupervised change detection is presented.
Proceedings ArticleDOI

Machine Learning based Surveillance System for Detection of Bike Riders without Helmet and Triple Rides

TL;DR: This work proposes a system based on the location of individual or different riders taking a trip on bikes with no helmets, which takes a video of traffic on an open street as an information and recognizes the moving items inside the scene.
Journal ArticleDOI

Performance Analysis of K-Means Clustering For Remotely Sensed Images

TL;DR: A novel method for unsupervised classification in multitemporal optical image based on DWT Feature Extraction and K-means clustering and analyzed using Matlab and ground truth data for improving classification accuracy.
Journal ArticleDOI

Performance Comparison of Wavelet and Contourlet Frame Based Features for Improving Classification Accuracy in Remote Sensing Images

TL;DR: In this paper, different contourlet frame based feature extraction techniques for remote sensing images are proposed Principal component analysis (PCA) method is used to reduce the number of features Gaussian Kernel fuzzy C-means classifiers uses these features to improve the classification accuracy Accuracy assessment based on field visit data and cluster validity measures are used to measure the accuracy of the classified data.