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Ken Eguchi

Researcher at Canon Inc.

Publications -  77
Citations -  1342

Ken Eguchi is an academic researcher from Canon Inc.. The author has contributed to research in topics: Langmuir–Blodgett film & Electrode. The author has an hindex of 21, co-authored 77 publications receiving 1333 citations. Previous affiliations of Ken Eguchi include Takeda Pharmaceutical Company.

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Patent

Method of forming deposition film

TL;DR: In this article, a method for forming a deposition film by introducing a starting gas for formation of the deposition film into a reaction chamber and forming a film on the substrate by irradiation with light is described.
Patent

Recording device and reproducing device

TL;DR: A recording and/or reproducing and erasing apparatus comprises a recording medium (101), a probe electrode (102, 1002) disposed in opposition to said recording medium, means (112, 1012) for applying a writing, reading or erasing voltage across said recording Medium and said probe electrode; and a feedback loop (106, 111, 1006, 1011) arranged to maintain either the distance between said recordingMedium and said probing electrode substantially constant or arranged to keep a substantially constant current flowing between them.
Journal ArticleDOI

Switching and memory phenomena in Langmuir–Blodgett films

TL;DR: In this article, it was shown that a metal/ Langmuir-Blodgett (LB) film/metal sandwich structure can switch from a nonconducting off state to a conducting on state via an intermediate state within less than 10 ns upon the application of a voltage.
Patent

Two scanning probes information recording/reproducing system with one probe to detect atomic reference location on a recording medium

TL;DR: In this article, an encoder includes an electrically conductive reference scale having surface steps formed at predetermined positions, an electric conductive probe having a tip disposed opposed to the reference scale, where the probe is relatively movable in a direction different from the opposing direction of the tip of the probe and the scale.
Journal ArticleDOI

Nanometer scale conductance change in a Langmuir‐Blodgett film with the atomic force microscope

TL;DR: A nanometer scale metal/Langmuir-Blodgett (LB) film/metal structure was realized with an atomic force microscope combined with scanning tunneling microscope (AFM/STM).