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Kwang Bo Shim

Researcher at Hanyang University

Publications -  166
Citations -  2993

Kwang Bo Shim is an academic researcher from Hanyang University. The author has contributed to research in topics: Spark plasma sintering & Nanocrystalline material. The author has an hindex of 29, co-authored 166 publications receiving 2695 citations. Previous affiliations of Kwang Bo Shim include University of West London.

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Significant enhancement of blue emission and electrical conductivity of N-doped graphene

TL;DR: In this article, the effects of annealing time on the structure, electrical and optical properties of N-doped graphene have been systematically investigated by using various analytical techniques, including XPS, FTIR, Raman, and XRD studies.
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Microwave-assisted synthesis of CaMoO4 nano-powders by a citrate complex method and its photoluminescence property

TL;DR: In this paper, nano-sized CaMoO 4 powders were successfully synthesized at low temperatures by a modified citrate complex method using microwave irradiation, which showed an ordinary tendency to increase with the temperatures.
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Comparison study of structural and optical properties of boron-doped and undoped graphene oxide films

TL;DR: In this paper, boron (B)-doped graphene oxides (GOs) were prepared by means of annealing the films, which were obtained from the suspensions of GO and H 3 BO 3 in N,N-Dimethylformamide solvent.
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Microwave-assisted synthesis of nanocrystalline MWO4 (M: Ca, Ni) via water-based citrate complex precursor

TL;DR: In this article, a modified citrate complex method assisted by microwave irradiation was used to synthesize nano-sized MWO 4 powders, which have scheelite and wolframite type structure.
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Microstructure and tribological properties of SiOx/DLC films grown by PECVD

TL;DR: In this article, the structural modification of pure DLC films was attempted by the addition of SiO structures into the DLC films and the chemical structures of SiO x /DLC films were investigated by FT-IR, XPS and Raman spectrometer and the microstructure by TEM.