Reverse logistics (RL) is gradually becoming more important to manufacturing companies through environmental awareness, competitiveness, and environmental regulations. In the leather footwear industry of Bangladesh, it is possible to recycle and reuse waste, meaning a reverse logistics system could increase return-on-investment and give a competitive advantage. To date, studies on barriers to RL implementation have been conducted in other countries and in other domains, leaving a research gap in RL barrier analyses in the leather footwear industry. There are many obstacles to implementing RL in a developing country like Bangladesh; examining these barriers is a crucial research issue. This paper identifies RL barriers through (1) an extent literature review, (2) advice from Bangladeshi industry experts under the Delphi study, and (3) ranking RL barriers using the fuzzy analytical hierarchy process. The results indicate that, of the barriers investigated, the ‘knowledge and support’ category seems to be most critical. A lack of interest and support from top-level management—related to ‘knowledge and support’ issues—appears to be the major obstacle for RL implementation in the Bangladeshi leather footwear industry. These findings will help the Bangladeshi leather footwear industry, as well as other industries in Bangladesh, to understand the nature of each barrier and overcome the complexity of RL implementation in supply chains. This study will also assist decision-makers in making certain strategic policies. Future studies may contribute to the life cycle assessment and engineering of recycled and reused footwear.

Examining barriers to reverse logistics practices in the leather footwear industry

In this paper, spectral subtraction is successfully applied to image processing and to detect defects in the integrated circuit (IC) image. By utilizing the characteristics of many of the same chips in a wafer, three images with defects located in the same position and different chips are obtained. The defect images contain the spectrum of standard image without any defects. Spectral subtraction presented in the paper can extract the standard image from the three defect images. The algorithm complexity of spectral subtraction detecting defects is close to that of Fourier transform. After obtaining the standard image, the speed and accuracy of defects detection can be greatly enhanced using the detection method presented in the paper. Using the image gray-scale matching technology, impact of illumination on IC defect detection is solved. Experiments demonstrate that spectral subtraction is fast and accurate to defect detection in an IC image, and the method has high robustness for illumination.

/pdf/defect-detection-of-ic-wafer-based-on-spectral-subtraction-13zc9v7lxd.pdf

Defect Detection of IC Wafer Based on Spectral Subtraction

In this work, the modified Sardar sub-equation method is used to construct optical soliton solutions to the coupled nonlinear Schrodinger equation (CNLSE) having third-order and fourth-order dispersions describing short-pulse propagation in two-core fibers. Several solutions are determined including W-shaped bright, dark soliton solutions, singular soliton solutions, periodic function solutions and the combined complex soliton solutions. It should be noted that this integration scheme is very powerful mathematical tools for obtaining exact optical soliton solutions of nonlinear evolution equations. Under suitable values for the physical parameters, some representative wave structures are graphically displayed. In addition, the linear stability technic is used to analyze the modulation gain spectra in the birefringence associated with an ellipticity angle. In our knowledge, these obtained results are new in the context of nonlinear birefringent optical fibers.

https://link.springer.com/content/pdf/10.1140/epjp/s13360-021-01358-3

Survey of third- and fourth-order dispersions including ellipticity angle in birefringent fibers on W-shaped soliton solutions and modulation instability analysis

http://www.xidian.edu.cn/hyjsktz/docs/20110222172828601857.pdf

Defect detection of IC wafer based on two-dimension wavelet transform

This paper presents a vision-based measurement methodology which utilises a micrometre calibration slide and confocal microscope. The technique is suitable for measurement of both angular and linear displacements. The algorithm presented in this paper overcomes the shortcomings of limited CCD pixel count and image size, out of focus areas at the boundaries of the image, and vertical motion of the slide out of the focal plane. Many parameters can be changed within the setup, allowing the resolution and range of measurement to be modified for a given application. Experimental verification has been performed in an angular measurement configuration, demonstrating noise-limited linear and angular resolutions of 0.04 μm and 0.29 μrad, respectively.

A vision-based measurement algorithm for micro/nano manipulation

Interaction between parabolic pulses in a dispersion-decreasing fiber

The relationship between the self-similar propagation region for single pulse and oscillation region for a pair of self-similar pulses are first investigated in our paper. By introducing self-similar coefficient F and RMS width ratio K, we find that self-similar propagation region starts from z = 1.8LD to z = 18LD while F ≤ 10%. The optimum output of self-similar pulse is also achieved when F and K reach a minimum value simultaneously at z = 3.5LD. The sinusoidal fit oscillation region of self-similar pulse pair ranges from 5/8LD to 2LD while F varies from 40.27 to 7.99%, and the dark soliton fit oscillation region ranges from 2LD to 6LD while F varies from 7.99 to 5.32%, indicating that the sinusoidal fit oscillation region almost occurs before the pulses enter the self-similar propagation region and the dark soliton fit oscillation region occurs within the self-similar pulse propagation region. Furthermore, the oscillation characteristics of interacting pulses are also studied numerically by using split-step Fourier method. The results are beneficial in Dense Wavelength Division Multiplexing transmission system which is in heavy demands of light source in wide-range wavelength.

/pdf/research-on-evolution-region-of-self-similar-pulses-in-a-37bldcbap5.pdf

Research on evolution region of self-similar pulses in a dispersion-decreasing fiber

A lot of vital defects appear in the process of fabrication of IC wafer. Material defect which mainly causes circuits to be connection failure is an important factor of reducing the yield of IC. So the inspection of material defect is one of the most important things to do for guaranteeing the quality of IC. In this paper, a machine visual test system is designed with AOI (Automated Optical Inspection) technology. The surface defects and geometric sizes of the IC wafer can be detected automatically. It introduces the method of image convolution of FPGA, by using assembly pipelining mode to design a real-time median filtering, to apply to the IC chip testing system which has good effect. Defect feature extraction and selection techniques were studied regarding the characteristics of inspection images of IC wafer. This machine vision test system is realized by FPGA based on XILINX Spartan-3A which is a high-speed parallel device.

A high speed image preprocessing method for IC wafer inspection

A new active contour modeling method for processing-path extraction of flexible material

Through analyzing the flexible material processing (FMP) deformation factors, it is pointed out that without a choice of deformation influence quantity would increase the compensation control predict model system input. In order to reduce the count of spatial dimensions of knowledge, we proposed the method by taking the use of FMP deformation compensation control knowledge extraction, which is based on decision table (DT) attribute reduction, deriving the algorithm that is based on information entropy attribute importance, to find the dependencies between attributes through attribute significance (AS) and to extract the intrinsic attributes which is the most close to deformation compensation control decision making. Finally, through an example presented in this paper to verify the efficiency of RS control knowledge extraction method. Compared with the Pawlak method and genetic extraction algorithm, the prediction accuracy of after reduction data is 0.55% less than Pawlak method and 3.64% higher than the g...

Liming Wu

Papers

Interaction between parabolic pulses in a dispersion-decreasing fiber

Research on evolution region of self-similar pulses in a dispersion-decreasing fiber

A high speed image preprocessing method for IC wafer inspection

A new active contour modeling method for processing-path extraction of flexible material

Study on the Extraction Method of Deformation Influence Factors of Flexible Material Processing Based on Information Entropy