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Lu Xu

Researcher at Harbin Engineering University

Publications -  8
Citations -  38

Lu Xu is an academic researcher from Harbin Engineering University. The author has contributed to research in topics: Optical path & Birefringence. The author has an hindex of 3, co-authored 8 publications receiving 21 citations.

Papers
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Journal ArticleDOI

Distributed Measurement of Polarization Characteristics for a Multifunctional Integrated Optical Chip: A Review

TL;DR: The distributed measurement of polarization characteristics for an MFIOC is reviewed, including the measurement principle based on the optical coherence domain polarimetry (OCDP), the modeling methodsbased on the Jones matrix and optical path, and the measurement performance.
Journal ArticleDOI

Self-Calibrated Absolute Thickness Measurement of Opaque Specimen Based on Differential White Light Interferometry

TL;DR: A new type of self-reference probe, which is composed of a fiber ferrule, an integrated beam splitter, and a gradient index lens, is presented, which allows a self-calibrated absolute thickness measurement method for opaque specimens based on fiber-optic white light interferometry.
Journal ArticleDOI

High-resolution distributed polarization crosstalk measurement for polarization maintaining fiber with considerable dispersion.

TL;DR: An iterative matched filter (IMF) method is presented to cope with the case of considerable birefringence dispersion of the PMF and obtained a spatial resolution of 0.09 m at any position of thePMF.
Patent

Common-path self-calibration film thickness measuring device and measuring method based on polarization multiplexing

TL;DR: In this paper, a common-path self-calibration film thickness measuring device and a measuring method based on polarization multiplexing was proposed, which includes a light source output module, a film thickness probing probe module, demodulation interferometer module, and an acquisition and control module.
Patent

Common-optical path self-calibrating thin film thickness measuring device and measuring method

TL;DR: In this paper, a common-optical path self-calibrating thin-film thickness measuring device and measuring method was proposed, which includes a light source output module, a film thickness measurement probe module, an interference and demodulation module and an acquisition and control module; the measuring probes of the measuring device of the invention can simultaneously realize the transmission and reflection of transmitted light, and the measurement of an absolute distance H between the two probes can be realized when no thin films to be measured exist.