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M

M. Poon

Researcher at University of Toronto

Publications -  13
Citations -  678

M. Poon is an academic researcher from University of Toronto. The author has contributed to research in topics: Tungsten & Irradiation. The author has an hindex of 11, co-authored 13 publications receiving 644 citations.

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Modelling deuterium release during thermal desorption of D + -irradiated tungsten

TL;DR: In this article, the authors used SIMS measurements of implantation profiles and using the multi-trap diffusion code TMAP7 to model the thermal desorption profiles of single crystal tungsten.
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The effect of ion damage on deuterium trapping in tungsten

TL;DR: In this paper, the effect of ion-induced damage due to prior ion implantation on deuterium retention in tungsten has been investigated, and it was shown that 1.5 keV D 3 + ions (500 eV/D + ) to 10 23 D/m 2 at 500 K showed a 3-4 increase in retention for specimens previously exposed to a fluence of 10 24 D/M 2 and a factor of 6-7 increase for specimens recently exposed to 3-times-10 24 Dm 2 over specimens exposed only to an incident flu
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Deuterium retention in tungsten for fusion use

TL;DR: In this article, the retention of deuterium in polycrystalline W foils has been measured as a function of ion fluence and implantation temperature, and the retention enhancement is attributed to an increase in the D diffusion coefficient, which allows a greater diffusion depth.
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Impurity effects and temperature dependence of D retention in single crystal tungsten

TL;DR: Deuterium retention in single crystal tungsten was measured as a function of implantation temperature (300-700 K), fluence (10 21 −10 25 D + /m 2 ǫs) and impurity levels for 500 eV/D + implantation as mentioned in this paper.
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Deuterium retention in single crystal tungsten

TL;DR: In this paper, the retention of deuterium in single crystal tungsten (SCW) has been measured at 300 and 500 K, as a function of incident ion fluence over the range 10 21 −10 24 D + / m 2.