M
M. Prokopiuk vel Prokopowicz
Researcher at Silesian University of Technology
Publications - 10
Citations - 70
M. Prokopiuk vel Prokopowicz is an academic researcher from Silesian University of Technology. The author has contributed to research in topics: Dye-sensitized solar cell & Auxiliary electrode. The author has an hindex of 6, co-authored 10 publications receiving 60 citations.
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Journal ArticleDOI
Carbon Nanotubes Counter Electrode for Dye-Sensitized Solar Cells Application
Aleksandra Drygała,L. A. Dobrzański,Marek Szindler,M. Prokopiuk vel Prokopowicz,Mirosława Pawlyta,Krzysztof Lukaszkowicz +5 more
TL;DR: Dye-sensitized solar cells (DSSC) as discussed by the authors are an attractive alternative to conventional crystalline silicon solar cells because of its low-cost, relatively high photon-to-current conversion efficiency for low energy consumption and simple fabrication process.
Journal ArticleDOI
Influence of laser texturization surface and atomic layer deposition on optical properties of polycrystalline silicon
Aleksandra Drygała,L. A. Dobrzański,Marek Szindler,Magdalena M. Szindler,M. Prokopiuk vel Prokopowicz,E. Jonda +5 more
TL;DR: In this article, the surface texturing of polycrystalline silicon based on the laser treatment and Al 2 O 3 antireflection coating (ARC) deposited by atomic layer deposition ALD is discussed.
Journal ArticleDOI
Nanocrystalline TiO2 Powder Prepared by Sol-Gel Method for Dye-Sensitized Solar Cells
Journal ArticleDOI
Carbon Nanomaterials Application as a Counter Electrode for Dye-Sensitized Solar Cells
A. Dobrzański,M. Prokopiuk vel Prokopowicz,Aleksandra Drygała,A. Wierzbicka,Krzysztof Lukaszkowicz,Marek Szindler +5 more
TL;DR: In this article, the structure investigation of a counter electrode in dye-sensitized solar cells using the carbon nanomaterials is presented, which is used to determine the properties of the cells and their parameters several surface sensitive techniques and methods, such as Raman spectroscopy, Scanning Electron Microscopy (SEM), HighResolution Transmission Electron microscopy (HRTEM), and electric properties of conductive layers were used.