M
Majid Aghababazadeh
Publications - 8
Citations - 228
Majid Aghababazadeh is an academic researcher. The author has contributed to research in topics: Die (integrated circuit) & Wafer. The author has an hindex of 5, co-authored 8 publications receiving 228 citations.
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Patent
System and apparatus for using test structures inside of a chip during the fabrication of the chip
TL;DR: In this article, the value of a specified performance parameter is determined at a plurality of locations on an active area of a die of the wafer, and evaluation information may then be obtained based on a variance of the values of the performance parameter at the plurality of positions.
Patent
Technique for evaluating a fabrication of a semiconductor component and wafer
TL;DR: In this article, the value of a specified performance parameter is determined at a plurality of locations on an active area of a die of the wafer, and evaluation information may then be obtained based on a variance of the values of the performance parameter at the plurality of positions.
Patent
Technique for evaluating a fabrication of a die and wafer
TL;DR: In this paper, the value of a specified performance parameter is determined at a plurality of locations on an active area of a die of the wafer, and evaluation information may then be obtained based on a variance of the values of the performance parameter at the plurality of positions.
Patent
Intra-chip power and test signal generation for use with test structures on wafers
TL;DR: In this paper, the value of a specified performance parameter is determined at a plurality of locations on an active area of a die of the wafer, and evaluation information may then be obtained based on a variance of the values of the performance parameter at the plurality of positions.
Patent
Contactless technique for evaluating a fabrication of a wafer
TL;DR: In this paper, the value of a specified performance parameter is determined at a plurality of locations on an active area of a die of the wafer, and evaluation information may then be obtained based on a variance of the values of the performance parameter at the plurality of positions.