M
Malcolm G. White
Researcher at National Institute of Standards and Technology
Publications - 27
Citations - 298
Malcolm G. White is an academic researcher from National Institute of Standards and Technology. The author has contributed to research in topics: NIST & Calibration. The author has an hindex of 10, co-authored 25 publications receiving 224 citations. Previous affiliations of Malcolm G. White include University of Colorado Boulder.
Papers
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Journal ArticleDOI
Decrease in reflectance of vertically-aligned carbon nanotubes after oxygen plasma treatment
TL;DR: Oxygen plasma treatment was used to lower the reflectance of multiwall vertically-aligned carbon nanotubes (VACNT) as mentioned in this paper, which showed a decrease in reflectance from 300-2400 nm, with up to 8 times lower reflectance at short wavelengths.
Journal ArticleDOI
Plasma modification of vertically aligned carbon nanotubes: Superhydrophobic surfaces with ultra-low reflectance
C. S. Yung,Nathan A. Tomlin,Karl Heuerman,Mark W. Keller,Malcolm G. White,Michelle Stephens,John H. Lehman +6 more
TL;DR: In this article, the authors show that O2 and CF4 plasmas can change the surface morphology of VACNTs similarly, which is associated with a corresponding measured reduction in spectral reflectance.
Journal Article
Decrease in reflectance of vertically-aligned carbon nanotubes after oxygen plasma treatment
Proceedings ArticleDOI
Compact spectral irradiance monitor flight demonstration mission
Erik Richard,David Harber,Ginger Drake,Joel Rutkowsi,Zach Castleman,Matthew Smith,Jacob Sprunck,W. Zheng,Paul Smith,Melanie Fisher,Alan Sims,Beth Cervelli,Maxwell Fowle,Marc L. Miller,Michael Chambliss,Thomas N. Woods,Peter Pilewskie,C. S. Yung,Michelle Stephens,Nathan A. Tomlin,Malcolm G. White,Malcolm G. White,John H. Lehman +22 more
TL;DR: The Compact Spectral Irradiance Monitor (CSIM) as discussed by the authors is a two-channel prism spectral radiometer incorporating Si, InGaAs, and extended InGaA focal plane photodiodes to record the solar spectrum daily across a continuous wavelength region spanning 200 − 2800 nm.
Journal ArticleDOI
Planar hyperblack absolute radiometer.
John H. Lehman,Andreas Steiger,Nathan A. Tomlin,Malcolm G. White,M. Kehrt,Ivan Ryger,Michelle Stephens,Christian Monte,Ingmar Mueller,Joerg Hollandt,Marla L. Dowell +10 more
TL;DR: The absolute responsivity of a planar cryogenic radiometer fabricated from micromachined silicon and having carbon nanotubes, as the absorber and thermistor were measured in the visible and far infrared wavelength range by means of detector-based radiometry.