다중혈관 관상동맥 환자에서 y-문합을 이용하여 양쪽 내흉동맥만을 사용한 우회술의 조기 성적

[신간의 별자리x] 우리/미술, 그리고 ‘슬픔의 박물관’

Deposits of clastic carbonate-dominated (calciclastic) sedimentary slope systems in the rock record have been identified mostly as linearly-consistent carbonate apron deposits, even though most ancient clastic carbonate slope deposits fit the submarine fan systems better. Calciclastic submarine fans are consequently rarely described and are poorly understood. Subsequently, very little is known especially in mud-dominated calciclastic submarine fan systems. Presented in this study are a sedimentological core and petrographic characterisation of samples from eleven boreholes from the Lower Carboniferous of Bowland Basin (Northwest England) that reveals a >250 m thick calciturbidite complex deposited in a calciclastic submarine fan setting. Seven facies are recognised from core and thin section characterisation and are grouped into three carbonate turbidite sequences. They include: 1) Calciturbidites, comprising mostly of highto low-density, wavy-laminated bioclast-rich facies; 2) low-density densite mudstones which are characterised by planar laminated and unlaminated muddominated facies; and 3) Calcidebrites which are muddy or hyper-concentrated debrisflow deposits occurring as poorly-sorted, chaotic, mud-supported floatstones. These

Phd by thesis

Overview of constitutive laws, kinematics, homogenization and multiscale methods in crystal plasticity finite-element modeling: Theory, experiments, applications

X-ray computer tomography (CT) is fast becoming an accepted tool within the materials science community for the acquisition of 3D images. Here the authors review the current state of the art as CT transforms from a qualitative diagnostic tool to a quantitative one. Our review considers first the image acquisition process, including the use of iterative reconstruction strategies suited to specific segmentation tasks and emerging methods that provide more insight (e.g. fast and high resolution imaging, crystallite (grain) imaging) than conventional attenuation based tomography. Methods and shortcomings of CT are examined for the quantification of 3D volumetric data to extract key topological parameters such as phase fractions, phase contiguity, and damage levels as well as density variations. As a non-destructive technique, CT is an ideal means of following structural development over time via time lapse sequences of 3D images (sometimes called 3D movies or 4D imaging). This includes information nee...

https://www.tandfonline.com/doi/pdf/10.1179/1743280413Y.0000000023

Quantitative X-ray tomography

A 99.995% pure Ni sample, compressed to 25%, was annealed in a SEM chamber and changes in the density of annealing twins were monitored in situ during recrystallization and grain growth. In addition to average microstructural measurements, the evolution of individual grains was also observed. Both the average annealing twin density in the recrystallized domain and the annealing twin density per grain increased during recrystallization. The rate of increase in twin density correlates with the velocity of the recrystallization front. During grain growth, however, the average annealing twin density decreased. The in situ EBSD observations showed both the formation of new twins and the extension of existing twins during annealing. The observations reported here suggest that the existing models for annealing twin formation are incomplete.

/pdf/annealing-twin-development-during-recrystallization-and-ym96fh69g6.pdf

Annealing twin development during recrystallization and grain growth in pure nickel

The aim of this work is to present a quantitative analysis of features involved in recovery during annealing of deformed Tantalum. In pure metals where crystalline defects usually have high mobility, dislocation annihilation and rearrangement occur to a great extent prior to recrystallization. Therefore a complete understanding of recrystallization cannot be accomplished without an advanced knowledge of the recovery phenomenon. Depending on whether dislocations induce a measurable curvature in the crystal lattice or not, they are called Geometrically Necessary Dislocations (GNDs) or Statistically Stored Dislocations (SSDs) respectively. In the present work only GNDs are considered. For this purpose electron backscatter diffraction (EBSD) is an advantageous technique to obtain statistically representative results when compared to Transmission Electron Microscopy (TEM). However, a quantitative analysis of GNDs from EBSD data is not straightforward. Since local misorientations are induced by the curvature of the crystal lattice caused by GNDs, GNDs analysis can be done using local misorientations. However the values obtained from this analysis are step size dependent and influenced by the measurement noise. Reasoning on the basis that when the step size tends to zero, local misorientation should also tend to zero, measurement noise can be estimated [1]. The measurement noise appears to notably be very much dependent on the amplitude of local misorientations, which must be considered in the perspective of GND density calculation

https://iopscience.iop.org/article/10.1088/1757-899X/89/1/012038/pdf

About quantitative EBSD analysis of deformation and recovery substructures in pure Tantalum

Single-crystal silicon is extensively used in the semiconductor industry. Even though most of the steps during processing involve somehow thermo-mechanical treatment of silicon, we will focus on two main domains where these properties play a major role: cleaving techniques used to obtain a thin silicon layer for photovoltaic applications and MEMS. The evolution and validation of these new processes often rely on numerical simulations. The accuracy of these simulations, however, requires accurate input data for a wide temperature range. Numerous studies have been performed, and most of the needed parameters are generally available in the literature, but unfortunately, some discrepancies are observed in terms of measured data regarding fracture mechanics parameters. The aim of this article is to gather all these data and discuss the validity of these properties between room temperature and 1273 K. Particular attention is given to silicon fracture properties depending on crystallographic orientations, and to the brittle–ductile temperature transition which can strongly affect the quality of silicon layers.

/pdf/thermo-mechanical-and-fracture-properties-in-single-crystal-w2gfcigpfy.pdf

Marc Bernacki

Papers

Annealing twin development during recrystallization and grain growth in pure nickel

About quantitative EBSD analysis of deformation and recovery substructures in pure Tantalum

Thermo-mechanical and fracture properties in single-crystal silicon

Level set framework for the numerical modelling of primary recrystallization in polycrystalline materials

Level set framework for the finite-element modelling of recrystallization and grain growth in polycrystalline materials