M
Marcel A. G. Zevenbergen
Researcher at IMEC
Publications - 32
Citations - 1538
Marcel A. G. Zevenbergen is an academic researcher from IMEC. The author has contributed to research in topics: Electrode & Reference electrode. The author has an hindex of 13, co-authored 32 publications receiving 1433 citations. Previous affiliations of Marcel A. G. Zevenbergen include Delft University of Technology.
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Direct Observation of Charge Inversion by Multivalent Ions as a Universal Electrostatic Phenomenon
TL;DR: The observed reversal of the polarity of charged surfaces in water upon the addition of trivalent and quadrivalent ions using atomic force microscopy supports the theoretical proposal that spatial correlations between ions are the driving mechanism behind charge inversion.
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Influence of Electrolyte Composition on Liquid-Gated Carbon Nanotube and Graphene Transistors
TL;DR: It is shown that the conductance of SWNTs and graphene is strongly affected by changes in the ionic strength, the pH, and the type of ions present, in a manner that can be qualitatively different for graphene and SWNT devices.
Journal Article
Direct Observation of Charge Inversion by Multivalent Ions as a Universal Electrostatic Phenomenon
Journal ArticleDOI
Stochastic sensing of single molecules in a nanofluidic electrochemical device.
Marcel A. G. Zevenbergen,Pradyumna S. Singh,Pradyumna S. Singh,Edgar D. Goluch,Bernhard Wolfrum,Serge G. Lemay,Serge G. Lemay +6 more
TL;DR: This new detection capability can serve as a powerful alternative when fluorescent labeling is invasive or impossible and enables new fundamental (bio)electrochemical experiments, for example, localized detection of neurotransmitter release, studies of enzymes with redox-active products, and single-cell electrochemical assays.
Journal ArticleDOI
Charge noise in graphene transistors.
Iddo Heller,Sohail Chatoor,Jaan Männik,Marcel A. G. Zevenbergen,Jeroen B. Oostinga,Jeroen B. Oostinga,Alberto F. Morpurgo,Alberto F. Morpurgo,Cees Dekker,Serge G. Lemay +9 more
TL;DR: It is shown that the gate dependence of the noise is well described by a charge-noise model, whereas Hooge's empirical relation fails to describe the data.