M
Marco Mulazzani
Researcher at Vienna University of Technology
Publications - 6
Citations - 663
Marco Mulazzani is an academic researcher from Vienna University of Technology. The author has contributed to research in topics: Dependability & Control reconfiguration. The author has an hindex of 3, co-authored 6 publications receiving 660 citations.
Papers
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Journal ArticleDOI
Distributed fault-tolerant real-time systems: the Mars approach
Hermann Kopetz,Andreas Damm,Christian Koza,Marco Mulazzani,W. Schwabl,C. Senft,R. Zainlinger +6 more
TL;DR: The authors focus on the maintainability of the Mars architecture, the Mars operating system, and the control of a rolling mill that produces metal plates and bars, and discuss timing analysis.
Journal ArticleDOI
Dependability Prediction: Comparison of Tools and Techniques
Marco Mulazzani,S K Trivedi +1 more
TL;DR: Important techniques for dependability modeling are discussed, including methods of model construction and model solution, and some of the recent software packages for dependable analysis are compared.
Book ChapterDOI
PMS-Models in SHARPE
H. Kantz,Marco Mulazzani +1 more
TL;DR: Dependability analysis of multiprocessor systems faces several difficulties: first, in general, the logical architecture is structured as a network, and a deep semantic dependency based on the connectivity of that network can be observed.
Journal ArticleDOI
Modeling of PMS—Structures in Sharpe
H. Kantz,Marco Mulazzani +1 more
TL;DR: The hierarchical modeling technique of SHARPE allows the combination of PMS- models with Markov models or other types of models: an example demonstrates how local dependencies like transient and permanent faults can be modeled byPMS-models in SHARPE.
Journal ArticleDOI
MARS: Ein fehlertolerantes, verteiltes Echtzeitsystem
Hermann Kopetz,Andreas Damm,Christian Koza,Marco Mulazzani,W. Schwabl,Christoph Senft,Ralph Zainlinger +6 more
TL;DR: Prof. Dr. Hermann Kopetz ist Gründungsmitgl ied der Österreichischen Computer Gesellschaft (OCG) and the IF IP WG 10.4, Mitglied the A C M and Senior Member the IEEE.