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Maria Pirga

Researcher at Warsaw University of Technology

Publications -  8
Citations -  93

Maria Pirga is an academic researcher from Warsaw University of Technology. The author has contributed to research in topics: Structured-light 3D scanner & Fourier transform. The author has an hindex of 4, co-authored 8 publications receiving 86 citations.

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Journal ArticleDOI

Two directional spatial-carrier phase-shifting method for analysis of crossed and closed fringe patterns

TL;DR: In this article, the analysis of a cross and closed fringe pattern with the information about the phenomena tested is performed by the spatial-carrier phase-shifting method used sequentially for x and y sampling directions.
Proceedings ArticleDOI

Errors in two-directional spatial-carrier phase-shifting method

TL;DR: This paper focuses on the major limitations for phase calculation by the standard 5-point algorithm used sequentially for x and y sampling directions and computer simulation reveals the character and magnitude of these major errors.
Journal ArticleDOI

Modified procedure for automatic surface topography

TL;DR: A fast technique for automated shape measurement in fringe projection crossed-optical-axes geometry system is proposed, based on the carrier-frequency phase-shifting method of fringe pattern analysis and automatic correction for the systematic errors.
Proceedings ArticleDOI

Errors in two-directional spatial-carrier phase shifting method for closed fringe patterns analysis

TL;DR: This paper focuses on the analysis of closed fringe pauern and the major limitations for the N-point algorithms (standard five-point, modified five- and threepoint algorithms) and the advantages of using the modified five and three-point algorithm.
Proceedings ArticleDOI

Adaptive automatic shape measurement system

Abstract: The new approach to the shape measurement system by implementations of adaptive and feed-back elements for an automated fringe projection system is proposed. Specifically the fringe pattern evaluation module based on the assessment of fringe pattern parameters performed by Fourier analysis and new version of spatial-carrier phase shifting method based on sampling in two directions are presented. The functioning of the system in the calibration and operational modes is shown on a representative example.