M
Michael Horn-von Hoegen
Researcher at University of Duisburg-Essen
Publications - 48
Citations - 1314
Michael Horn-von Hoegen is an academic researcher from University of Duisburg-Essen. The author has contributed to research in topics: Electron diffraction & Ultrafast electron diffraction. The author has an hindex of 15, co-authored 48 publications receiving 1136 citations.
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Journal ArticleDOI
Electronic acceleration of atomic motions and disordering in bismuth
Germán Sciaini,Maher Harb,Sergei G. Kruglik,T. Payer,Christoph T. Hebeisen,Frank-J. Meyer zu Heringdorf,Mariko Yamaguchi,Michael Horn-von Hoegen,Ralph Ernstorfer,Ralph Ernstorfer,R. J. Dwayne Miller +10 more
TL;DR: A femtosecond electron diffraction study of the structural changes in crystalline bismuth as it undergoes laser-induced melting finds that the dynamics of the phase transition depend strongly on the excitation intensity, with melting occurring within 190 fs at the highest excitation.
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Interplay of wrinkles, strain, and lattice parameter in graphene on iridium.
H. Hattab,Alpha T. N'Diaye,D. Wall,C. Klein,Giriraj Jnawali,Johann Coraux,Carsten Busse,Raoul van Gastel,Bene Poelsema,Thomas Michely,Frank-J. Meyer zu Heringdorf,Michael Horn-von Hoegen +11 more
TL;DR: Following graphene growth by thermal decomposition of ethylene on Ir(111) at high temperatures, data reveals a characteristic hysteresis of the graphene lattice parameter that is explained by the interplay of reversible wrinkle formation and film strain.
Journal ArticleDOI
In situ observation of stress relaxation in epitaxial graphene
Alpha T. N'Diaye,Raoul van Gastel,Antonio J. Martínez-Galera,Johann Coraux,Johann Coraux,H. Hattab,D. Wall,Frank-J. Meyer zu Heringdorf,Michael Horn-von Hoegen,José M. Gómez-Rodríguez,Bene Poelsema,Carsten Busse,Thomas Michely +12 more
TL;DR: In this paper, the authors demonstrate that branched line defects develop in epitaxial graphene grown at high temperature on Pt(111) and Ir(111), and demonstrate that these defects are wrinkles in the graphene layer, i.e. stripes of partially delaminated graphene.
Journal ArticleDOI
In situ observation of stress relaxation in epitaxial graphene
Alpha T. N'Diaye,Raoul van Gastel,Antonio J. Martínez-Galera,Johann Coraux,Johann Coraux,H. Hattab,D. Wall,Frank-J. Meyer zu Heringdorf,Michael Horn-von Hoegen,José M. Gómez-Rodríguez,Bene Poelsema,Carsten Busse,Thomas Michely +12 more
TL;DR: In this paper, the authors demonstrate that branched line defects develop in epitaxial graphene grown at high temperature on Pt(111) and Ir(111), and demonstrate that these defects are wrinkles in the graphene layer, i.e. stripes of partially delaminated graphene.
Journal ArticleDOI
Normal-Incidence Photoemission Electron Microscopy (NI-PEEM) for Imaging Surface Plasmon Polaritons
Philip Kahl,Simone Wall,Simone Wall,Christian Witt,Christian Schneider,Daniela Bayer,Alexander Fischer,Pascal Melchior,Michael Horn-von Hoegen,Martin Aeschlimann,Frank-J. Meyer zu Heringdorf +10 more
TL;DR: In this paper, a femtosecond normal-incidence photoemission microscopy (NI-PEEM) was proposed to provide a direct descriptive visualization of SPP wave packets propagating across a metal surface.