Showing papers by "Michael Stadermann published in 2003"
TL;DR: In this paper, a tuning-fork-based atomic force microscopy (AFM) setup is presented that is capable of mapping the surface contact resistance while scanning topography, using etched Pt/Ir tips, which have higher durability and better conductivity than probes used in earlier AFM conductance measurements.
Abstract: We present a quartz tuning-fork-based atomic force microscopy (AFM) setup that is capable of mapping the surface contact resistance while scanning topography. The tuning-fork setup allows us to use etched Pt/Ir tips, which have higher durability and better conductivity than probes used in earlier AFM conductance measurements. The performance of the method is demonstrated with contact resistance measurements of gold lines on silicon dioxide and carbon nanotubes on graphite.
13 citations