scispace - formally typeset
Search or ask a question

Showing papers by "Miroslav Karlík published in 2015"


Journal ArticleDOI
TL;DR: In this article, the formation of intermetallics in Ni-Ti system by reactive sintering at 500 and 650°C was studied and the reaction was determined to be diffusion-controlled.

38 citations


Journal ArticleDOI
TL;DR: In this article, the evolution of Ni-Ti intermetallics in two non-conventional production techniques for the synthesis of NiTi shape memory alloy was compared, and the same phases' formation sequence was determined for both processes.
Abstract: The aim of the present paper was to compare the evolution of Ni–Ti intermetallics in two non-conventional production techniques for the synthesis of NiTi shape memory alloy. Short term ultrahigh energy mechanical alloying is proposed to be able to describe the early stages of the milling process, which was not described in the literature previously, and to obtain intermetallics in shorter process durations. The reactive sintering using high heating rate (>300°C min− 1) is a process designed to suppress the formation of secondary intermetallics and to reduce the porosity of the product. The same phases' formation sequence was determined for both processes. The detrimental Ti2Ni phase forms preferentially, and therefore, its presence cannot be avoided in any of the investigated techniques.

23 citations


Journal ArticleDOI
TL;DR: In this article, the influence of rolling reduction on the size and distribution of secondary particles and recrystallization behavior of Al-Mn sheets with Zr addition prepared by twin-roll casting (TRC) in the industrial conditions was investigated.

11 citations


Journal ArticleDOI
TL;DR: In this article, during SHS Process P.Novák, A.K. Michalcová, P.M. Marek, T.F. Hau2ild and J. Kope£ek Institute of Chemical Technology, Prague, Department of Metals and Corrosion Engineering.
Abstract: during SHS Process P. Novák, A. Michalcová, A. ’koláková, F. Pr·2a, J. K°ío, I. Marek, T.F. Kubatík, M. Karlík, P. Hau2ild and J. Kope£ek Institute of Chemical Technology, Prague, Department of Metals and Corrosion Engineering, Technická 5, 166 28 Prague 6, Czech Republic Institute of Plasma Physics AS CR, v.v.i., Za Slovankou 1782/3, 182 00 Prague 8, Czech Republic Czech Technical University in Prague, Faculty of Nuclear Sciences and Physical Engineering, Department of Materials, Trojanova 13, 120 00 Prague 2, Czech Republic Institute of Physics of the ASCR, v.v.i., Na Slovance 2, 182 21 Prague 8, Czech Republic

11 citations


Journal ArticleDOI
01 Aug 2015
TL;DR: In this article, a dossier traite, de maniere pratique, de la formation of l'image globale en microscopie electronique en transmission (MET), which is obtenue de different manieres.
Abstract: Ce dossier traite, de maniere pratique, de la formation de l'image globale en microscopie electronique en transmission (MET), qui est obtenue de differentes manieres. Le point essentiel concerne la position du diaphragme, dit de contraste, qui se trouve dans le plan focal de la lentille objectif. Les differents types de contraste, notamment de diffraction, d'interferences (contraste de phase), en Z (utilise en STEM, microscopie electronique a balayage en transmission) sont repertories dans ce texte. L'energie des electrons, la qualite de la source (emission de champ, cathode emissive en LaB 6 ...) sont egalement primordiales. La correction des aberrations de l'objectif, notamment l'aberration spherique, permet d'ameliorer fortement la resolution, puisqu'elle peut etre maintenant meilleure que le dixieme de nanometre (elle peut atteindre 0,05 nm). Il est montre que le contraste d'une image est profondement relie aux diverses reflexions qui constituent le diagramme de diffraction (par exemple dans l'etude des precipites). Le mode haute resolution (contraste d'interferences) permet d'observer l'image dite de structure qui, selon la resolution du microscope, revele des colonnes ou des petits ensembles de colonnes atomiques. Dans cette approche, les defauts cristallins peuvent etre observes et leurs caracteristiques determinees, mais en prenant egalement quelques precautions qui dependent du niveau d'information desire. L'utilisation de codes de simulations des images est devenue indispensable. Le dossier aborde rapidement l'holographie qui permet, par exemple, d'etudier des repartitions de potentiel electrique dans des coupes minces de transistors.

9 citations


Journal ArticleDOI
TL;DR: In this article, the authors applied Resonant Ultraspectral Spectroscopy (RUS) to detect the ductile-to-brittle and brittle-toductile transitions in an AA6262 free-cutting aluminum alloy during thermal cycling.
Abstract: Resonant ultrasound spectroscopy (RUS) is applied to detect the ductile-to-brittle and brittle-to-ductile transitions in an AA6262 free-cutting aluminum alloy during thermal cycling. It is shown that the RUS method is sensitive enough to detect reliably the melting and solidification temperatures of micro-sized Mg3Bi2–Bi eutectic particles responsible for these transitions, although the volume fraction of the particles is very small (~1%) and is even decreasing with the cycling. The proposed RUS approach is compared with differential scanning calorimetry (DSC); the latter method is shown to be unable to detect the transition temperatures especially when transition intervals are broad. The results reveal that the phase transitions of the eutectic particles exhibit a significant hysteresis and pronounced asymmetry between melting and solidification.

6 citations


Journal ArticleDOI
01 Aug 2015
TL;DR: In this paper, l'analyse chimique locale en microscopie electronique (MET and STEM) est de plus en plus utilisee, sont decrites, de maniere pratique, les deux techniques qui equipent les microscopes actuels, l'analysis des rayons X caracteristiques (EDXS - energy dispersive X-ray spectroscopy) and la spectrometrie des pertes d'energie (EELS - electron energy loss spectrometry).
Abstract: Pour la comprehension des proprietes des materiaux, l'analyse chimique locale en microscopie electronique (MET et STEM) est de plus en plus utilisee. Dans ce dossier, sont decrites, de maniere pratique, les deux techniques qui equipent les microscopes actuels, l'analyse des rayons X caracteristiques (EDXS - energy dispersive X-ray spectroscopy) et la spectrometrie des pertes d'energie (EELS - electron energy loss spectrometry). Dans la partie pertes d'energie, les transitions de faible energie (excitations de plasmons, transitions interbandes, effet Cerenkov...) ne sont pas traitees. Seule l'utilisation des seuils d'ionisation caracteristiques des atomes est abordee.

3 citations