https://link.springer.com/content/pdf/10.1007/s13369-021-06182-6.pdf

Comparative Analysis of AlexNet, ResNet18 and SqueezeNet with Diverse Modification and Arduous Implementation

The theme of this paper is improved planning of binomial sequential probability ratio tests in the context of comparison of two objects as to their time between failures or to failure, assumed to be exponentially distributed. The authors’ earlier works established that the probabilities of I- and II- type errors (α and β) are discrete in character and do not lend themselves to analytical expression. Accordingly, the choice of the optimal parameters for the decision boundaries necessitates a search for extrema in discrete sets. The present work outlines a procedure that involves application of the continued-fractions theory, and permits finding the set of boundary positions in which the test characteristics undergo changes. It was established, that in the domains described in the earlier papers, the relationships of α and β versus these positions are close to planar and – within narrow limits – stepwise. The step sizes are highly variable, so that the standard minimum search procedures are either cumbersom...

Search boundaries of the truncated discrete sequential test

We investigate the problem of dynamic power optimization through gate sizing and voltage scaling under a given delay constraint. Several algorithms have been proposed in the literature to handle gate sizing and voltage scaling independently or together with the goal of satisfying certain power budget constraints without affecting the timing constraints. Decentralized algorithms have been proposed in the literature for distributing a divisible resource among the components of the system. We formulate the problems as economic models that attempt to distribute the delay among the gates of the circuit such that the dynamic power of the circuit is optimized. Since, optimizing all the gates in the circuit at the same time can be computationally intensive, the gates in a given path are handled together. The circuits are represented as economic models and mathematical formulations are developed which are further transformed as game theoretic models for which Nash equilibrium based solutions are investigated. Thus, the main contribution of this work is the application of microeconomic models and game theory for these VLSI CAD problems. Models are developed for the gate sizing, voltage scaling and simultaneous gate sizing and voltage scaling problems. The algorithms are iterative, fast, simple and can lead to rapid convergence. Competition among the gates can provide the best overall optimization. In the proposed algorithms, the gates compete against each other to optimize their power consumption and hence that of the entire circuit. The proposed solutions yield better power optimization than other methods as shown in the experimental results for MCNC '91 benchmark circuits.

A microeconomic model for simultaneous gate sizing and voltage scaling for power optimization

Purpose – This paper aims to propose a methodology for planning of a truncated sequential probability ratio test (SPRT) in which two systems with exponentially distributed times between failures (TBFs) are compared. The study is concerned with tests with arbitrary probabilities of I‐ and II‐type errors.Design/methodology/approach – The study methodology, based on the proposed optimality criteria for these tests, permitted comparison of different modes of truncation and obviated the drawbacks of discreteness and multidimensionality of their characteristics.Findings – The solution permits planning of a heavily‐truncated test with an average sample number exceeding its counterpart for the optimal (non‐truncated) test by at most a specified percentage. Relationships are outlined for optimal selection of the truncated test boundaries. So are optimality estimation criteria for the constructed test. The superiority of the SPRTs, truncated by the proposed methodology, over their counterparts, processed according ...

Sequential testing for two exponential distributions at arbitrary risks

The present study deals with the planning methodology of tests in which the parameters of two exponentially-distributed random variables are compared. The largest application field of such tests is reliability checking of electronics equipment. They are highly cost-intensive, and the requirements as to their resolution capability become stricter all the time. Hence the topicality and importance of an optimal plan permitting decisions at a given risk level on the basis of a minimal sample size. Such comparison tests are required for example in assessing the desirability of replacing a “basic” object whose reliability is unknown, by a “new” one; or when the influence of test conditions on the results has to be eliminated. This is the case when an electronics manufacturing process is transferred to another site and the product undergoes accelerated testing. Recently, equipment and methods were developed for accelerated product testing through continuous observation of a population of copies and replacement of failed objects without interrupting the test. For such a procedure, the sequential approach is a feasible and efficacious solution with substantial shortening – on the average – of the test duration (see e.g. Chandramouli et al. 1998; Chien et al. 2007). In these circumstances there is high uncertainty in the acceleration factor, with the same effect on the estimated reliability parameters of the product. This drawback can be remedied by recourse to comparison testing. The latter serves also for reliability matching in objects of the same design and different origins, or a redesigned product versus its earlier counterpart, or different products with the same function (see e.g. Chien & Yang, 2007; Kececioglu, 2002). The exponential nature of the Time Between Failures (TBF) of repairable objects, or the time to failure of non-repairable ones – is noted in the extensive literature on the reliability of electronic equipment (Kececioglu, 2002; Chandramouli et al, 1998; Drenick, 1960; Sr-332, 2001; MIL-HDBK-781A, 1996). For brevity, the TBF acronym is used in the sequel for both these notations. Mace (1974, Sec. 6.12) proposed, for this purpose, the so-called fixed sample size test with the number of failures of each object fixed in advance – which is highly inconvenient from the practical viewpoint. For example, when the "basic" object has "accumulated" the

/pdf/comparison-sequential-test-for-mean-times-between-failures-2re3u9w5ic.pdf

Comparison Sequential Test for Mean Times Between Failures

We propose a sequential probability ratio test (SPRT) based on a 2-parameter Weibull distribution for integrated-circuit (IC) failure analysis. The shape parameter of the Weibull distribution characterizes the decreasing, constant, or increasing failure rate regions in the bath tub model for IC. The algorithm (SD) detects the operating region of the IC based on the observed failure times. Unlike the fixed-length tests, the SD, due to its sequential nature, uses the minimum average number of devices for the test for fixed error tolerances in the detection procedure. We find that SD is, on average, 96% more statistically efficient than the fixed-length test. SD is highly robust to the variations in the model parameters, unlike other existing sequential tests. Since the accuracy of the tests and the test length are conflicting requirements, we also propose a truncated SD which allows a better control of this tradeoff. It has both the sequential nature of examining measurements and the fixed-length property of guaranteeing that the tolerances be met approximately with a specified number of available measurements.

N. Ranganathan

Papers

Sequential tests for integrated-circuit failures